SOI 2D photonic crystals for microphotonic integrated circuits

S. J. McNab, Yurii A Vlasov

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We review recent achievements in fabrication of silicon-on-insulator 2D photonic crystals compatible with microelectronics processing will be reported. We first address the problem of radiation and propagation losses by quantitative measurements of transmission spectra for various designs of photonic crystal waveguides. In optimized structures record low propagation losses of 20 dB/cm are reported. Next we show the way to effectively couple the light from the fiber to high index microphotonic circuits and photonic crystals by proper design of mode converter and butt-coupler.

Original languageEnglish (US)
Title of host publication2003 IEEE/LEOS - Summer Topical Meeting
Subtitle of host publicationHoley Fibers and Photonic Crystals
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages79-80
Number of pages2
ISBN (Electronic)0780379829, 9780780379824
DOIs
StatePublished - Jan 1 2003
Externally publishedYes
Event2003 IEEE/LEOS - Summer Topical Meeting - Vancouver, Canada
Duration: Jul 14 2003Jul 16 2003

Publication series

NameLEOS Summer Topical Meeting
Volume2003-January
ISSN (Print)1099-4742

Other

Other2003 IEEE/LEOS - Summer Topical Meeting
CountryCanada
CityVancouver
Period7/14/037/16/03

Keywords

  • Coupling circuits
  • Fabrication
  • Integrated circuit measurements
  • Loss measurement
  • Microelectronics
  • Optical coupling
  • Photonic crystals
  • Photonic integrated circuits
  • Propagation losses
  • Silicon on insulator technology

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

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  • Cite this

    McNab, S. J., & Vlasov, Y. A. (2003). SOI 2D photonic crystals for microphotonic integrated circuits. In 2003 IEEE/LEOS - Summer Topical Meeting: Holey Fibers and Photonic Crystals (pp. 79-80). [1224284] (LEOS Summer Topical Meeting; Vol. 2003-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/LEOSST.2003.1224284