TY - GEN
T1 - Software upset analysis
T2 - 2nd IEEE Asian Test Symposium, ATS 1993
AU - Choi, G. S.
AU - Iyer, R. K.
N1 - Publisher Copyright:
© 1993 IEEE.
PY - 1993
Y1 - 1993
N2 - This paper describes a simulation based approach to quantify the impact of low-level transient errors at the software execution level. Automated analysis, for the run-time injection of transients at the device level and the assessment of the resulting impact on the program-control flow, is described. Using test workloads, the type of upsets at the program-flow level which can result from fault injection are determined. The methodology is illustrated by a case study of a microprocessor, used in the jet-engine controller of Boeing 747 and 757 aircrafts. For each section in the test program, the chance of having single and multiple upsets from the fault injection is determined. The analysis showed that about 20% of all upsets are multiple in nature. The result suggests that current methods of validation that assume single upsets may be inadequate.
AB - This paper describes a simulation based approach to quantify the impact of low-level transient errors at the software execution level. Automated analysis, for the run-time injection of transients at the device level and the assessment of the resulting impact on the program-control flow, is described. Using test workloads, the type of upsets at the program-flow level which can result from fault injection are determined. The methodology is illustrated by a case study of a microprocessor, used in the jet-engine controller of Boeing 747 and 757 aircrafts. For each section in the test program, the chance of having single and multiple upsets from the fault injection is determined. The analysis showed that about 20% of all upsets are multiple in nature. The result suggests that current methods of validation that assume single upsets may be inadequate.
KW - Design for dependability
KW - Fault injection
KW - Single and multiple upsets
KW - Statistical analysis
KW - VLSI simulation
UR - http://www.scopus.com/inward/record.url?scp=85064677538&partnerID=8YFLogxK
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U2 - 10.1109/ATS.1993.398778
DO - 10.1109/ATS.1993.398778
M3 - Conference contribution
AN - SCOPUS:85064677538
T3 - Proceedings of the Asian Test Symposium
SP - 49
EP - 54
BT - ATS 1993 Proceedings - 2nd Asian Test Symposium
PB - IEEE Computer Society
Y2 - 16 November 1993 through 18 November 1993
ER -