@inproceedings{d3e5da8d5c2b421795d6c9e53b0d3f96,
title = "Software canaries: Software-based path delay fault testing for variation-aware energy-efficient design",
abstract = "Software-based path delay fault testing (SPDFT) has been used to identify faulty chips that cannot meet timing constraints due to gross delay defects. In this paper, we propose using SPDFT for a new purpose-aggressively selecting the operating point of a variation-affected design. In order to use SPDFT for this purpose, test routines must provide high coverage of potentially-critical paths and must have low dynamic performance overhead. We describe how to apply SPDFT for selecting an energy-efficient operating point for a variation-affected processor and demonstrate that our test routines achieve ample coverage and low overhead.",
keywords = "Benchmark testing, Delays, Generators, Hardware, Safety",
author = "John Sartori and Rakesh Kumar",
note = "Publisher Copyright: {\textcopyright} 2014 ACM.; ACM/IEEE International Symposium on Low Power Electronics and Design, ISLPED 2014 ; Conference date: 11-08-2014 Through 13-08-2014",
year = "2015",
month = oct,
day = "13",
doi = "10.1145/2627369.2627646",
language = "English (US)",
series = "Proceedings of the International Symposium on Low Power Electronics and Design",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "159--164",
booktitle = "Proceedings of the 2014 ACM/IEEE International Symposium on Low Power Electronics and Design, ISLPED 2014",
address = "United States",
}