Snapshot advantage: A review of the light collection improvement for parallel high-dimensional measurement systems

Nathan Hagen, Robert T. Kester, Liang Gao, Tomasz S. Tkaczyk

Research output: Contribution to journalArticle

Abstract

The snapshot advantage is a large increase in light collection efficiency available to high-dimensional measurement systems that avoid filtering and scanning. After discussing this advantage in the context of imaging spectrometry, where the greatest effort towards developing snapshot systems has been made, we describe the types of measurements where it is applicable. We then generalize it to the larger context of high-dimensional measurements, where the advantage increases geometrically with measurement dimensionality.

Original languageEnglish (US)
Article number111702
JournalOptical Engineering
Volume51
Issue number11
DOIs
StatePublished - 2012

Keywords

  • Advantage
  • High-dimensional systems
  • Imaging spectrometry
  • Snapshot
  • Throughput

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Engineering(all)

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