Small-angle x-ray scattering measurements of hydrogen evolution from an epitaxial Nb film

Brent J. Heuser, Monica M.C. Allain, W. C. Chen

Research output: Contribution to journalArticlepeer-review

Abstract

Small-angle x-ray scattering (SAXS) measurements have been performed to investigate particle morphology during in situ hydrogen evolution from a 1000-Å epitaxial Nb film on (1120) sapphire initially loaded to saturation with hydrogen. The SAXS intensity follows the plate or disk single-particle form factor (Q-2, where Q is the wave-vector transfer) during hydrogen evolution. A fit to this power-law behavior yields a plate thickness of ≈7 Å. A second power-law behavior (Q-3) was observed after complete hydrogen evolution. This power law corresponds to the small-angle scattering response from edge dislocations and is consistent with the broadening of the lattice mosaic induced by hydride decomposition.

Original languageEnglish (US)
Article number155419
Pages (from-to)1554191-1554195
Number of pages5
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume66
Issue number15
DOIs
StatePublished - Oct 15 2002

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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