Single-shot, full characterization of a single-photon state

O. Gazzano, T. Thomay, E. Goldschmidt, S. V. Polyakov, V. Loo, G. S. Solomon

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Quantum light parameters (purity, indistinguishability,...) are usually determined using multiple sequential measurements. We demonstrate an efficient single-shot scheme to characterize a quantum dot light using two number-resolving detectors, here simulated by four single-photon detectors.

Original languageEnglish (US)
Title of host publication2016 Conference on Lasers and Electro-Optics, CLEO 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781943580118
DOIs
StatePublished - Dec 16 2016
Externally publishedYes
Event2016 Conference on Lasers and Electro-Optics, CLEO 2016 - San Jose, United States
Duration: Jun 5 2016Jun 10 2016

Publication series

Name2016 Conference on Lasers and Electro-Optics, CLEO 2016

Other

Other2016 Conference on Lasers and Electro-Optics, CLEO 2016
Country/TerritoryUnited States
CitySan Jose
Period6/5/166/10/16

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'Single-shot, full characterization of a single-photon state'. Together they form a unique fingerprint.

Cite this