Single-shot edge illumination x-ray phase-contrast tomography enabled by joint image reconstruction

Yujia Chen, Huifeng Guan, Charlotte K. Hagen, Alessandro Olivo, Mark A. Anastasio

Research output: Contribution to journalArticlepeer-review


Edge illumination x-ray phase-contrast tomography (EIXPCT) is an emerging x-ray phase-contrast tomography technique for reconstructing the complex-valued x-ray refractive index distribution of an object. Conventional image reconstruction approaches for EIXPCT require multiple images to be acquired at each tomographic view angle. This contributes to prolonged data-acquisition times and elevated radiation doses, which can hinder in vivo applications. In this work, a new "single-shot" method is proposed for joint reconstruction (JR) of the real and imaginary-valued components of the refractive index distribution from a tomographic data set that contains only a single image acquired at each view angle. The proposed method is predicated on a nonlinear formulation of the inverse problem that is solved by using a gradient-based optimization method. The method is validated and investigated using computer-simulated and experimental EIXPCT data sets.

Original languageEnglish (US)
Pages (from-to)619-622
Number of pages4
JournalOptics Letters
Issue number3
StatePublished - Feb 1 2017
Externally publishedYes

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics


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