Single-qubit, entanglement-assisted and ancilla-assisted quantum process tomography

J. B. Altepeter, D. Branning, E. Jeffrey, T. C. Wei, Paul G Kwiat, R. T. Thew, J. L. O'Brien, M. A. Nielsen, A. G. White

Research output: Contribution to conferencePaperpeer-review

Abstract

Quantum process tomography allows complete and precise characterization of a quantum operation. We report quantum process tomography of unitary, decohering, and partially polarizing operations using single-qubit, maximally entangled, and non-entangled input states.

Original languageEnglish (US)
StatePublished - Dec 1 2003
EventTrends in Optics and Photonics Series: Quantum electronics and Laser Science (QELS) - Baltimore, MD., United States
Duration: Jun 1 2003Jun 6 2003

Other

OtherTrends in Optics and Photonics Series: Quantum electronics and Laser Science (QELS)
CountryUnited States
CityBaltimore, MD.
Period6/1/036/6/03

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Fingerprint Dive into the research topics of 'Single-qubit, entanglement-assisted and ancilla-assisted quantum process tomography'. Together they form a unique fingerprint.

Cite this