Single-qubit, entanglement-assisted and ancilla-assisted quantum process tomography

J. B. Altepeter; D. Branning; E. Jeffrey; T. C. Wei; P. G. Kwiat; R. T. Thew; J. L. O'Brien; M. A. Nielsen; A. G. White

Single-qubit, entanglement-assisted and ancilla-assisted quantum process tomography

J. B. Altepeter, D. Branning, E. Jeffrey, T. C. Wei, P. G. Kwiat, R. T. Thew, J. L. O'Brien, M. A. Nielsen, A. G. White

Research output: Contribution to conference › Paper › peer-review

Abstract

Quantum process tomography allows complete and precise characterization of a quantum operation. We report quantum process tomography of unitary, decohering, and partially polarizing operations using single-qubit, maximally entangled, and non-entangled input states.

Original language	English (US)
Pages	QTuI4/1-QTuI4/3
State	Published - 2003
Event	Trends in Optics and Photonics Series: Quantum electronics and Laser Science (QELS) - Baltimore, MD., United States Duration: Jun 1 2003 → Jun 6 2003

Other

Other	Trends in Optics and Photonics Series: Quantum electronics and Laser Science (QELS)
Country/Territory	United States
City	Baltimore, MD.
Period	6/1/03 → 6/6/03

ASJC Scopus subject areas

General Physics and Astronomy

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Altepeter, J. B., Branning, D., Jeffrey, E., Wei, T. C., Kwiat, P. G., Thew, R. T., O'Brien, J. L., Nielsen, M. A., & White, A. G. (2003). Single-qubit, entanglement-assisted and ancilla-assisted quantum process tomography. QTuI4/1-QTuI4/3. Paper presented at Trends in Optics and Photonics Series: Quantum electronics and Laser Science (QELS), Baltimore, MD., United States.

Altepeter, JB, Branning, D, Jeffrey, E, Wei, TC, Kwiat, PG, Thew, RT, O'Brien, JL, Nielsen, MA & White, AG 2003, 'Single-qubit, entanglement-assisted and ancilla-assisted quantum process tomography', Paper presented at Trends in Optics and Photonics Series: Quantum electronics and Laser Science (QELS), Baltimore, MD., United States, 6/1/03 - 6/6/03 pp. QTuI4/1-QTuI4/3.

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title = "Single-qubit, entanglement-assisted and ancilla-assisted quantum process tomography",

abstract = "Quantum process tomography allows complete and precise characterization of a quantum operation. We report quantum process tomography of unitary, decohering, and partially polarizing operations using single-qubit, maximally entangled, and non-entangled input states.",

author = "Altepeter, {J. B.} and D. Branning and E. Jeffrey and Wei, {T. C.} and Kwiat, {P. G.} and Thew, {R. T.} and O'Brien, {J. L.} and Nielsen, {M. A.} and White, {A. G.}",

year = "2003",

language = "English (US)",

pages = "QTuI4/1--QTuI4/3",

note = "Trends in Optics and Photonics Series: Quantum electronics and Laser Science (QELS) ; Conference date: 01-06-2003 Through 06-06-2003",

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TY - CONF

T1 - Single-qubit, entanglement-assisted and ancilla-assisted quantum process tomography

AU - Altepeter, J. B.

AU - Branning, D.

AU - Jeffrey, E.

AU - Wei, T. C.

AU - Kwiat, P. G.

AU - Thew, R. T.

AU - O'Brien, J. L.

AU - Nielsen, M. A.

AU - White, A. G.

PY - 2003

Y1 - 2003

N2 - Quantum process tomography allows complete and precise characterization of a quantum operation. We report quantum process tomography of unitary, decohering, and partially polarizing operations using single-qubit, maximally entangled, and non-entangled input states.

AB - Quantum process tomography allows complete and precise characterization of a quantum operation. We report quantum process tomography of unitary, decohering, and partially polarizing operations using single-qubit, maximally entangled, and non-entangled input states.

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M3 - Paper

AN - SCOPUS:1542608362

SP - QTuI4/1-QTuI4/3

T2 - Trends in Optics and Photonics Series: Quantum electronics and Laser Science (QELS)

Y2 - 1 June 2003 through 6 June 2003

ER -

Single-qubit, entanglement-assisted and ancilla-assisted quantum process tomography

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