Keyphrases
Monte Carlo Method
100%
Banded Structure
100%
Long-term Memory
100%
Memory Device
100%
Semiconductors
33%
Potential Profile
33%
Device-independent
33%
Electron Injection
33%
Device Operation
33%
Gate Bias
33%
Gate Structure
33%
Gate Oxide
33%
Conduction Band Edge
33%
Drift-diffusion
33%
Hot Electrons
33%
Drain Bias
33%
Gate Injection
33%
Floating Gate
33%
Electron Distribution Function
33%
Injection Current
33%
Pisces
33%
Prototype Structure
33%
Practical Simulation
33%
Monte Carlo Simulator
33%
Charging Characteristics
33%
High-energy Tail
33%
Post-processor
33%
Engineering
Simulators
100%
Longer Term
100%
Monte Carlo Approach
100%
Term Memory
100%
Experimental Result
50%
Gate Bias
50%
Gate Oxide
50%
Conduction Band Edge
50%
Hot Electron
50%
Drain Bias
50%
Current Injection
50%
Floating Gate
50%
Electron Effect
50%
Drain Separation
50%
Electron Distribution Function
50%
Material Science
Silicon
100%
Oxide Compound
100%
Hot Electron
100%