Simulating electron microscope diffraction mode with a macintosh-based program

Jian-Min Zuo, H. R. Zhu, Andrew Spence

Research output: Contribution to journalArticlepeer-review

Abstract

A Mackintosh based program which simulates electron diffraction pattern in the same way as the operation of electron microscope diffraction mode is described. The program can be used with the same set of controls existing on the modern electron microscope. The possible applications of this program are namely, indexing diffraction patterns, beam direction measurement, lattice parameter, and teaching electron diffraction.

Original languageEnglish (US)
Pages (from-to)1210-1211
Number of pages2
JournalProceedings - Annual Meeting, Microscopy Society of America
StatePublished - 1993
Externally publishedYes

ASJC Scopus subject areas

  • Engineering(all)

Fingerprint

Dive into the research topics of 'Simulating electron microscope diffraction mode with a macintosh-based program'. Together they form a unique fingerprint.

Cite this