Simulating electron microscope diffraction mode with a macintosh-based program

J. M. Zuo, H. R. Zhu, Andrew Spence

Research output: Contribution to journalConference articlepeer-review


A Mackintosh based program which simulates electron diffraction pattern in the same way as the operation of electron microscope diffraction mode is described. The program can be used with the same set of controls existing on the modern electron microscope. The possible applications of this program are namely, indexing diffraction patterns, beam direction measurement, lattice parameter, and teaching electron diffraction.

Original languageEnglish (US)
Pages (from-to)1210-1211
Number of pages2
JournalProceedings - Annual Meeting, Microscopy Society of America
StatePublished - 1993
Externally publishedYes
EventProceedings of the 51st Annual Meeting Microscopy Society of America - Cincinnati, OH, USA
Duration: Aug 1 1993Aug 6 1993

ASJC Scopus subject areas

  • General Engineering


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