A Mackintosh based program which simulates electron diffraction pattern in the same way as the operation of electron microscope diffraction mode is described. The program can be used with the same set of controls existing on the modern electron microscope. The possible applications of this program are namely, indexing diffraction patterns, beam direction measurement, lattice parameter, and teaching electron diffraction.
|Original language||English (US)|
|Number of pages||2|
|Journal||Proceedings - Annual Meeting, Microscopy Society of America|
|State||Published - 1993|
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