Simulating electron microscope diffraction mode with a macintosh-based program

J. M. Zuo; H. R. Zhu; Andrew Spence

Simulating electron microscope diffraction mode with a macintosh-based program

J. M. Zuo, H. R. Zhu, Andrew Spence

Research output: Contribution to journal › Conference article › peer-review

Abstract

A Mackintosh based program which simulates electron diffraction pattern in the same way as the operation of electron microscope diffraction mode is described. The program can be used with the same set of controls existing on the modern electron microscope. The possible applications of this program are namely, indexing diffraction patterns, beam direction measurement, lattice parameter, and teaching electron diffraction.

Original language	English (US)
Pages (from-to)	1210-1211
Number of pages	2
Journal	Proceedings - Annual Meeting, Microscopy Society of America
State	Published - 1993
Externally published	Yes
Event	Proceedings of the 51st Annual Meeting Microscopy Society of America - Cincinnati, OH, USA Duration: Aug 1 1993 → Aug 6 1993

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General Engineering

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title = "Simulating electron microscope diffraction mode with a macintosh-based program",

abstract = "A Mackintosh based program which simulates electron diffraction pattern in the same way as the operation of electron microscope diffraction mode is described. The program can be used with the same set of controls existing on the modern electron microscope. The possible applications of this program are namely, indexing diffraction patterns, beam direction measurement, lattice parameter, and teaching electron diffraction.",

author = "Zuo, {J. M.} and Zhu, {H. R.} and Andrew Spence",

year = "1993",

language = "English (US)",

pages = "1210--1211",

journal = "Proceedings - Annual Meeting, Microscopy Society of America",

issn = "0424-8201",

note = "Proceedings of the 51st Annual Meeting Microscopy Society of America ; Conference date: 01-08-1993 Through 06-08-1993",

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T1 - Simulating electron microscope diffraction mode with a macintosh-based program

AU - Zuo, J. M.

AU - Zhu, H. R.

AU - Spence, Andrew

PY - 1993

Y1 - 1993

N2 - A Mackintosh based program which simulates electron diffraction pattern in the same way as the operation of electron microscope diffraction mode is described. The program can be used with the same set of controls existing on the modern electron microscope. The possible applications of this program are namely, indexing diffraction patterns, beam direction measurement, lattice parameter, and teaching electron diffraction.

AB - A Mackintosh based program which simulates electron diffraction pattern in the same way as the operation of electron microscope diffraction mode is described. The program can be used with the same set of controls existing on the modern electron microscope. The possible applications of this program are namely, indexing diffraction patterns, beam direction measurement, lattice parameter, and teaching electron diffraction.

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UR - http://www.scopus.com/inward/citedby.url?scp=0027704942&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:0027704942

SN - 0424-8201

SP - 1210

EP - 1211

JO - Proceedings - Annual Meeting, Microscopy Society of America

JF - Proceedings - Annual Meeting, Microscopy Society of America

T2 - Proceedings of the 51st Annual Meeting Microscopy Society of America

Y2 - 1 August 1993 through 6 August 1993

ER -

Simulating electron microscope diffraction mode with a macintosh-based program

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