TY - JOUR
T1 - Silicon Dioxide Deposited Using Atmospheric Pressure Plasma Chemical Vapor Deposition for Improved Adhesion and Water Intrusion Resistance for Lightweight Manufacturing
AU - Jeckell, Zachary
AU - Patel, Dhruval
AU - Herschberg, Andrew
AU - Choi, Tag
AU - Barlaz, David
AU - Bonova, Lucia
AU - Shchelkanov, Ivan
AU - Jurczyk, Brian
AU - Ruzic, David
N1 - RBS and SEM analysis were carried out at the Materials Research Laboratory Central Research Facilities, University of Illinois. Lap shear testing was carried out in part in the Advanced Materials Testing and Evaluation Laboratory, University of Illinois. Thanks to Dr. Peter Kurath for assistance with lap shear. Thanks to Blair Carlson at General Motors for many fruitful discussions. Funding: This work was supported by the Office of Energy Efficiency and Renewable Energy [DE-EE0008319]
Funding: This work was supported by the Office of Energy Efficiency and Renewable Energy [ DE-EE0008319 ]
PY - 2021/4
Y1 - 2021/4
N2 - This work aims to demonstrate the barrier coating, and adhesion promoting properties of silica-based coatings deposited using an atmospheric pressure plasma torch (APPT). This is achieved by applying an industrial grade adhesive to silica thin films deposited, on the surfaces to be joined, using atmospheric pressure plasma chemical vapor deposition (APP-CVD), to make single joint lap shear samples of different metal combinations commonly found in lightweight manufacturing, such as aluminum and magnesium as well as steel. To deposit these thin films, two separate silicon based organic precursors, hexamethyldisiloxane (HMDSO), and tetraehylorthosilicate (TEOS), are used. Samples are bonded using DuPont Betamate 1486 adhesive, and the lap shear results for these films are compared to the lap shear results of a chemically cleaned control using the same adhesive. The APPT uses a microwave power supply and gas mixtures of N2 and Ar. The adhesion of the films are tested using lap shear, and elevated temperature water soaks are conducted on the joints as well to simulate environmental exposure. Lap shear results, from samples with silica thin films, have an increase of max shear stress of 25%-115% compared to control samples depending on material. After exposure to water soak the max shear strength of the joints decreased by less than 15%, which demonstrates the films capabilities as a water barrier. Film morphology is examined using Scanning Electron Microscopy (SEM), and the film's composition and approximate thickness are obtained using Rutherford Backscattering Spectroscopy (RBS).
AB - This work aims to demonstrate the barrier coating, and adhesion promoting properties of silica-based coatings deposited using an atmospheric pressure plasma torch (APPT). This is achieved by applying an industrial grade adhesive to silica thin films deposited, on the surfaces to be joined, using atmospheric pressure plasma chemical vapor deposition (APP-CVD), to make single joint lap shear samples of different metal combinations commonly found in lightweight manufacturing, such as aluminum and magnesium as well as steel. To deposit these thin films, two separate silicon based organic precursors, hexamethyldisiloxane (HMDSO), and tetraehylorthosilicate (TEOS), are used. Samples are bonded using DuPont Betamate 1486 adhesive, and the lap shear results for these films are compared to the lap shear results of a chemically cleaned control using the same adhesive. The APPT uses a microwave power supply and gas mixtures of N2 and Ar. The adhesion of the films are tested using lap shear, and elevated temperature water soaks are conducted on the joints as well to simulate environmental exposure. Lap shear results, from samples with silica thin films, have an increase of max shear stress of 25%-115% compared to control samples depending on material. After exposure to water soak the max shear strength of the joints decreased by less than 15%, which demonstrates the films capabilities as a water barrier. Film morphology is examined using Scanning Electron Microscopy (SEM), and the film's composition and approximate thickness are obtained using Rutherford Backscattering Spectroscopy (RBS).
KW - Atmospheric pressure plasma
KW - barrier coating
KW - chemical vapor deposition
KW - lap shear strength
KW - silicon oxide
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U2 - 10.1016/j.surfin.2021.100989
DO - 10.1016/j.surfin.2021.100989
M3 - Article
AN - SCOPUS:85101307648
SN - 2468-0230
VL - 23
JO - Surfaces and Interfaces
JF - Surfaces and Interfaces
M1 - 100989
ER -