Signal and Power Integrity Design and Analysis for Bunch-of-Wires (BoW) Interface for Chiplet Integration on Advanced Packaging

Ram Krishna, Atom O. Watanabe, John W. Golz, Ravi Bonam, Frank R. Libsch, Elyse Rosenbaum, Arvind Kumar

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This work advances the current understanding and performance assessment of chiplet interfaces by providing a framework for modeling and joint simulation of signal and power integrity of BoW-based die-to-die interconnects with advanced packaging technology. The study covers data rates up to 16 Gbps. This paper presents a circuit-level implementation of the BoW slice that consists of a driver on one chiplet and a receiver on another chiplet. This work compares the performance of various combinations of high-density transmission lines with different line-and-space and wirelengths. It presents configurations of the BoW data lines that have extremely low power dissipation, less than 0.2 pJ/bit at 8 and 16 Gbps.

Original languageEnglish (US)
Title of host publicationProceedings - IEEE 73rd Electronic Components and Technology Conference, ECTC 2023
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1004-1011
Number of pages8
ISBN (Electronic)9798350334982
DOIs
StatePublished - 2023
Event73rd IEEE Electronic Components and Technology Conference, ECTC 2023 - Orlando, United States
Duration: May 30 2023Jun 2 2023

Publication series

NameProceedings - Electronic Components and Technology Conference
Volume2023-May
ISSN (Print)0569-5503

Conference

Conference73rd IEEE Electronic Components and Technology Conference, ECTC 2023
Country/TerritoryUnited States
CityOrlando
Period5/30/236/2/23

Keywords

  • Bunch-of- Wires
  • Power integrity
  • Signal integrity
  • chiplet
  • interconnects

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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