@article{4ff6a16ff11a471184e006fb1d326597,
title = "Shear-band structure and chemistry in a Zr-based metallic glass probed with nano-beam x-ray fluorescence and transmission electron microscopy",
abstract = "An apparent local change in chemistry in shear-bands can be observed in a Zr-based metallic glass using correlative x-ray fluorescence and electron spectroscopy. Further analysis suggests that this finding is due to the local volumetric change of the shear-band structure. These results emphasize the importance of correlated analytical methods to unambiguously reveal structural and chemical changes caused by strain localization in metallic glasses.",
keywords = "Fluorescence, Metallic glass, Shear-band chemistry, Shear-band structure, Transmission electron microscopy",
author = "C. Liu and Z. Cai and X. Xia and V. Roddatis and R. Yuan and Zuo, {J. M.} and R. Maa{\ss}",
note = "This research was carried out in part in the Frederick Seitz Materials Research Laboratory Central Research Facilities at UIUC and the 26-ID beamline at the Advanced Photon Source at Argonne National Laboratory. RM gratefully acknowledges start-up funds provided by the Department of Materials Science and Engineering at UIUC. The authors are grateful to C.A. Volkert for institutional support, to V. Radisch for excellent support in sample preparation, to Z. Hitchens for data analysis, and to S. K{\"u}chemann and M. Holt for experimental support. RY thanks the Intel Corporation for his support through a SRC project. Use of the Advanced Photon Source and the Center for Nanoscale Materials, both Office of Science user facilities, was supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357. This research was carried out in part in the Frederick Seitz Materials Research Laboratory Central Research Facilities at UIUC and the 26-ID beamline at the Advanced Photon Source at Argonne National Laboratory. RM gratefully acknowledges start-up funds provided by the Department of Materials Science and Engineering at UIUC . The authors are grateful to C.A. Volkert for institutional support, to V. Radisch for excellent support in sample preparation, to Z. Hitchens for data analysis, and to S. K{\"u}chemann and M. Holt for experimental support. RY thanks the Intel Corporation for his support through a SRC project. Use of the Advanced Photon Source and the Center for Nanoscale Materials, both Office of Science user facilities, was supported by the U.S. Department of Energy , Office of Science, Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357 .",
year = "2019",
month = aug,
doi = "10.1016/j.scriptamat.2019.05.005",
language = "English (US)",
volume = "169",
pages = "23--27",
journal = "Scripta Materialia",
issn = "1359-6462",
publisher = "Acta Materialia Inc",
}