Set-Codes with Small Intersections and Small Discrepancies

Ryan Gabrys, H. Dau, C. J. Colbourn, O. Milenkovic

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We are concerned with the problem of designing large families of subsets over a common labeled ground set that have small pairwise intersections and the property that the maximum discrepancy of the label values within each of the sets is less than or equal to one. Our results, based on transversal designs, factorizations of packings and Latin rectangles, show that by jointly constructing the sets and labeling scheme, one can achieve optimal family sizes for many parameter choices. Probabilistic arguments akin to those used for pseudorandom generators lead to significantly suboptimal results when compared to the proposed combinatorial methods. The design problem considered is motivated by applications in molecular data storage.

Original languageEnglish (US)
Title of host publication2019 IEEE International Symposium on Information Theory, ISIT 2019 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages2359-2363
Number of pages5
ISBN (Electronic)9781538692912
DOIs
StatePublished - Jul 2019
Event2019 IEEE International Symposium on Information Theory, ISIT 2019 - Paris, France
Duration: Jul 7 2019Jul 12 2019

Publication series

NameIEEE International Symposium on Information Theory - Proceedings
Volume2019-July
ISSN (Print)2157-8095

Conference

Conference2019 IEEE International Symposium on Information Theory, ISIT 2019
CountryFrance
CityParis
Period7/7/197/12/19

ASJC Scopus subject areas

  • Theoretical Computer Science
  • Information Systems
  • Modeling and Simulation
  • Applied Mathematics

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    Gabrys, R., Dau, H., Colbourn, C. J., & Milenkovic, O. (2019). Set-Codes with Small Intersections and Small Discrepancies. In 2019 IEEE International Symposium on Information Theory, ISIT 2019 - Proceedings (pp. 2359-2363). [8849651] (IEEE International Symposium on Information Theory - Proceedings; Vol. 2019-July). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISIT.2019.8849651