TY - GEN
T1 - Separating SCR and trigger circuit related overshoot in SCR-based ESD protection circuits
AU - Mertens, Robert
AU - Rosenbaum, Elyse
PY - 2013/10/16
Y1 - 2013/10/16
N2 - Circuit simulation is proposed as an aid for design optimization of SCR-based ESD protection circuits. The compact models used in this work are validated by measurements. During simulation, the waveforms at the internal circuit nodes are probed; these indicate that the SCR causes most of the voltage overshoot and presents the greatest opportunity for overshoot reduction.
AB - Circuit simulation is proposed as an aid for design optimization of SCR-based ESD protection circuits. The compact models used in this work are validated by measurements. During simulation, the waveforms at the internal circuit nodes are probed; these indicate that the SCR causes most of the voltage overshoot and presents the greatest opportunity for overshoot reduction.
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M3 - Conference contribution
AN - SCOPUS:84890525436
SN - 9781585372324
T3 - Electrical Overstress/Electrostatic Discharge Symposium Proceedings
BT - Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2013
T2 - 2013 35th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2013
Y2 - 8 September 2013 through 13 September 2013
ER -