Separating SCR and trigger circuit related overshoot in SCR-based ESD protection circuits

Robert Mertens, Elyse Rosenbaum

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Circuit simulation is proposed as an aid for design optimization of SCR-based ESD protection circuits. The compact models used in this work are validated by measurements. During simulation, the waveforms at the internal circuit nodes are probed; these indicate that the SCR causes most of the voltage overshoot and presents the greatest opportunity for overshoot reduction.

Original languageEnglish (US)
Title of host publicationElectrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2013
StatePublished - Oct 16 2013
Event2013 35th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2013 - Las Vegas, NV, United States
Duration: Sep 8 2013Sep 13 2013

Publication series

NameElectrical Overstress/Electrostatic Discharge Symposium Proceedings
ISSN (Print)0739-5159

Other

Other2013 35th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2013
CountryUnited States
CityLas Vegas, NV
Period9/8/139/13/13

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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  • Cite this

    Mertens, R., & Rosenbaum, E. (2013). Separating SCR and trigger circuit related overshoot in SCR-based ESD protection circuits. In Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2013 [6635915] (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).