This paper reports micrometer-scale strain measurements that are enabled through the observed wavelength shift in a stretched surface photonic crystal narrow bandwidth optical reflectance filter. The photonic crystal optical filter is comprised of a 550 nm period, dielectric-coated linear grating structure, which was fabricated on the surface of a thin sheet of silicone rubber. When stretched, the change in grating period induced a change in the wavelength of light coupled into the photonic crystal, which could be measured using a spectrometer. The observed wavelength change was 4.53 nm per 1% strain and was linear up to 3.75% strain. The measurement was affected by temperature fluctuations, which could be compensated. The resolution of the measurement was 78 με.

Original languageEnglish (US)
Pages (from-to)66-71
Number of pages6
JournalSensors and Actuators, A: Physical
Issue number1-2
StatePublished - Jun 2010


  • Microstrain
  • Photonic crystal
  • Strain sensor

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics
  • Electronic, Optical and Magnetic Materials
  • Metals and Alloys
  • Surfaces, Coatings and Films
  • Instrumentation


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