Abstract
This paper reports micrometer-scale strain measurements that are enabled through the observed wavelength shift in a stretched surface photonic crystal narrow bandwidth optical reflectance filter. The photonic crystal optical filter is comprised of a 550 nm period, dielectric-coated linear grating structure, which was fabricated on the surface of a thin sheet of silicone rubber. When stretched, the change in grating period induced a change in the wavelength of light coupled into the photonic crystal, which could be measured using a spectrometer. The observed wavelength change was 4.53 nm per 1% strain and was linear up to 3.75% strain. The measurement was affected by temperature fluctuations, which could be compensated. The resolution of the measurement was 78 με.
Original language | English (US) |
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Pages (from-to) | 66-71 |
Number of pages | 6 |
Journal | Sensors and Actuators, A: Physical |
Volume | 161 |
Issue number | 1-2 |
DOIs | |
State | Published - Jun 2010 |
Keywords
- Microstrain
- Photonic crystal
- Strain sensor
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Condensed Matter Physics
- Electronic, Optical and Magnetic Materials
- Metals and Alloys
- Surfaces, Coatings and Films
- Instrumentation