Abstract
We study self-constructing and self-repairing electrical connections built by agglomeration of metallic particles between two electrodes. Our experiments show that self-assembling electrical connections grow by building a chain of particles between two electrodes immersed in a dielectric liquid. We find that the growth time for the self-assembling process is a linear function of the initial average spacing of metallic particles and a linear function of the distance between the electrodes. Furthermore, the experiments demonstrate the ability of the electrical connection to self-repair following small perturbations. We show that the agglomeration process occurs in such a way as to minimize the overall resistance of the system. We discuss possible future applications of this phenomenon for fabricating nanoscale circuits.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 496-506 |
| Number of pages | 11 |
| Journal | Physical Review E - Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics |
| Volume | 54 |
| Issue number | 1 |
| DOIs | |
| State | Published - 1996 |
| Externally published | Yes |
ASJC Scopus subject areas
- Statistical and Nonlinear Physics
- Statistics and Probability
- Condensed Matter Physics
Fingerprint
Dive into the research topics of 'Self-assembling electrical connections based on the principle of minimum resistance'. Together they form a unique fingerprint.Cite this
- APA
- Standard
- Harvard
- Vancouver
- Author
- BIBTEX
- RIS