Self-assembled monolayers of Lewis bases: effects on surface and interfacial electronic properties in III-V optical semiconductors

J. F. Dorsten, James E. Maslar, Y. Zhang, T. B. Rauchfuss, Paul W. Bohn, S. Agarwala, Ilesanmi Adesida, C. Caneau, Rajaram J. Bhat

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The nature and disposition of surface states can have a dramatic effect on the near-surface electronic properties in semiconductor heterostructures. In particular the lack of a well-defined surface oxide in III-V materials means that surface band bending can cause surface recombination velocities to be up to 103 larger than in Si-based materials. Raman scattering by coupled longitudinal optic phonons and 2D electron gas electrons in In 0.52Al0.48AsIn0.53Ga0.47As δ-doped heterostructures is used to demonstrate the extreme sensitivity to surface states. The two highest frequency modes, of the three coupled electron-phonon modes expected in this system, were observed, with the L+ mode being identified for the first time in InGaAs-based systems. The large dispersion of this mode makes it a particularly sensitive probe for changes in such properties as carrier concentration and subband energy. For structures with higher carrier concentrations coupling of the longitudinal optic phonon to multiple electron intersubband transitions is resolved. In order to passivate native surface states organic thiols are being investigated. Measurements on bulk GaAs indicate a change in the surface depletion region thickness, within the abrupt junction model, of up to 50 angstrom (ca. 30%). Changes in carrier scattering times up to 50% have also been observed.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsHai-Lung Dai, Steven J. Sibener
PublisherSociety of Photo-Optical Instrumentation Engineers
Pages51-58
Number of pages8
ISBN (Print)0819414182
StatePublished - 1994
EventLaser Techniques for Surface Science - Los Angeles, CA, USA
Duration: Jan 27 1994Jan 29 1994

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume2125
ISSN (Print)0277-786X

Other

OtherLaser Techniques for Surface Science
CityLos Angeles, CA, USA
Period1/27/941/29/94

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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