Seeing Inside Shocked Plastic-Bonded Explosives

Dhanalakshmi Sellan; Lawrence Salvati; Siva Kumar Valluri; Dana D. Dlott; Xuan Zhou

doi:10.1063/12.0020351

Seeing Inside Shocked Plastic-Bonded Explosives

Dhanalakshmi Sellan, Lawrence Salvati, Siva Kumar Valluri, Dana D. Dlott, Xuan Zhou

Research output: Contribution to journal › Conference article › peer-review

Abstract

A new method is described to study how microstructures within a plastic-bonded explosive (PBX) interact with shock waves to produce hot spots, and to identify the critical hot spots that grow into a deflagration. A unique feature of this method is that it allows us to see every crystal in the PBX during the shock. We used an HMX-based PBX fabricated into a wafer about one crystal thick so there are no crystals hidden from view. The wafer is embedded in a transparent polymer in a traveling wave geometry, and a microscope with a laser flyer launcher and a nanosecond camera is used to watch hot spots appear and grow so we can determine which microstructural elements favor or disfavor hot spots.

Original language	English (US)
Article number	320001
Journal	AIP Conference Proceedings
Volume	2844
Issue number	1
DOIs	https://doi.org/10.1063/12.0020351
State	Published - Sep 26 2023
Event	22nd Biennial American Physical Society Conference on Shock Compression of Condensed Matter, SCCM 2022 - Anaheim, United States Duration: Jul 10 2022 → Jul 15 2022

ASJC Scopus subject areas

General Physics and Astronomy

Online availability

10.1063/12.0020351

Library availability

Discover UIUC Full Text

Cite this

@article{6a076bc9c28a4b9eb8cb0e9e546ee53d,

title = "Seeing Inside Shocked Plastic-Bonded Explosives",

abstract = "A new method is described to study how microstructures within a plastic-bonded explosive (PBX) interact with shock waves to produce hot spots, and to identify the critical hot spots that grow into a deflagration. A unique feature of this method is that it allows us to see every crystal in the PBX during the shock. We used an HMX-based PBX fabricated into a wafer about one crystal thick so there are no crystals hidden from view. The wafer is embedded in a transparent polymer in a traveling wave geometry, and a microscope with a laser flyer launcher and a nanosecond camera is used to watch hot spots appear and grow so we can determine which microstructural elements favor or disfavor hot spots.",

author = "Dhanalakshmi Sellan and Lawrence Salvati and Valluri, {Siva Kumar} and Dlott, {Dana D.} and Xuan Zhou",

note = "Publisher Copyright: {\textcopyright} 2023 American Institute of Physics Inc.. All rights reserved.; 22nd Biennial American Physical Society Conference on Shock Compression of Condensed Matter, SCCM 2022 ; Conference date: 10-07-2022 Through 15-07-2022",

year = "2023",

month = sep,

day = "26",

doi = "10.1063/12.0020351",

language = "English (US)",

volume = "2844",

journal = "AIP Conference Proceedings",

issn = "0094-243X",

publisher = "American Institute of Physics",

number = "1",

}

TY - JOUR

T1 - Seeing Inside Shocked Plastic-Bonded Explosives

AU - Sellan, Dhanalakshmi

AU - Salvati, Lawrence

AU - Valluri, Siva Kumar

AU - Dlott, Dana D.

AU - Zhou, Xuan

PY - 2023/9/26

Y1 - 2023/9/26

N2 - A new method is described to study how microstructures within a plastic-bonded explosive (PBX) interact with shock waves to produce hot spots, and to identify the critical hot spots that grow into a deflagration. A unique feature of this method is that it allows us to see every crystal in the PBX during the shock. We used an HMX-based PBX fabricated into a wafer about one crystal thick so there are no crystals hidden from view. The wafer is embedded in a transparent polymer in a traveling wave geometry, and a microscope with a laser flyer launcher and a nanosecond camera is used to watch hot spots appear and grow so we can determine which microstructural elements favor or disfavor hot spots.

AB - A new method is described to study how microstructures within a plastic-bonded explosive (PBX) interact with shock waves to produce hot spots, and to identify the critical hot spots that grow into a deflagration. A unique feature of this method is that it allows us to see every crystal in the PBX during the shock. We used an HMX-based PBX fabricated into a wafer about one crystal thick so there are no crystals hidden from view. The wafer is embedded in a transparent polymer in a traveling wave geometry, and a microscope with a laser flyer launcher and a nanosecond camera is used to watch hot spots appear and grow so we can determine which microstructural elements favor or disfavor hot spots.

UR - http://www.scopus.com/inward/record.url?scp=85177590184&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85177590184&partnerID=8YFLogxK

U2 - 10.1063/12.0020351

DO - 10.1063/12.0020351

M3 - Conference article

AN - SCOPUS:85177590184

SN - 0094-243X

VL - 2844

JO - AIP Conference Proceedings

JF - AIP Conference Proceedings

IS - 1

M1 - 320001

T2 - 22nd Biennial American Physical Society Conference on Shock Compression of Condensed Matter, SCCM 2022

Y2 - 10 July 2022 through 15 July 2022

ER -

Seeing Inside Shocked Plastic-Bonded Explosives

Abstract

ASJC Scopus subject areas

Online availability

Library availability

Related links

Fingerprint

Cite this