TY - GEN
T1 - Security and Reliability Challenges in Machine Learning for EDA
T2 - 24th International Symposium on Quality Electronic Design, ISQED 2023
AU - Xie, Zhiyao
AU - Peng, Yifeng
AU - Zhang, Tong
N1 - This research was supported by ACCESS AI Chip Center for Emerging Smart Systems, sponsored by InnoHK funding, Hong Kong SAR. We thank Chen-Chia Chang and Jingyu Pan from Duke University for their thoughts and advice.
This research was supported by ACCESS – AI Chip Center for Emerging Smart Systems, sponsored by InnoHK funding, Hong Kong SAR. We thank Chen-Chia Chang and Jingyu Pan from Duke University for their thoughts and advice.
PY - 2023
Y1 - 2023
N2 - The growing IC complexity has led to a compelling need for design efficiency improvement through new electronic design automation (EDA) methodologies. In recent years, many innovative machine learning (ML)-based solutions have been proposed for EDA applications. While these ML solutions demonstrate great potential in the circuit design flow, however, the hidden security and model reliability problems are rarely discussed until recently. In this paper, we present some latest research advances in the security and reliability challenges in ML for EDA.
AB - The growing IC complexity has led to a compelling need for design efficiency improvement through new electronic design automation (EDA) methodologies. In recent years, many innovative machine learning (ML)-based solutions have been proposed for EDA applications. While these ML solutions demonstrate great potential in the circuit design flow, however, the hidden security and model reliability problems are rarely discussed until recently. In this paper, we present some latest research advances in the security and reliability challenges in ML for EDA.
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U2 - 10.1109/ISQED57927.2023.10129359
DO - 10.1109/ISQED57927.2023.10129359
M3 - Conference contribution
AN - SCOPUS:85161619633
T3 - Proceedings - International Symposium on Quality Electronic Design, ISQED
BT - Proceedings of the 24th International Symposium on Quality Electronic Design, ISQED 2023
PB - IEEE Computer Society
Y2 - 5 April 2023 through 7 April 2023
ER -