Secondary ion mass spectrometry analysis of vertical cavity surface-emitting lasers

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)949-952
Number of pages4
JournalJournal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Volume22
Issue number3
DOIs
StatePublished - 2004

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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