Scanning tunneling microscope-based nanolithography for electronic device fabrication

Joseph W. Lyding, Roger T. Brockenbrough, Patrick J. Fay, John R. Tucker, Karl Hess, Ted K. Higman

Research output: Contribution to journalConference article

Abstract

The scanning tunneling microscope (STM) has evolved from a new surface science tool into one capable of performing surface modifications down to nanometer and even atomic dimensions. This suggests the possibility of developing STM-based lithography strategies for the fabrication of electronic device structures with nanometer scale features. On this size scale, it should be possible for quantum interference and coulomb charging effects to influence device function at 77 K or even higher temperatures. This chapter reviews our progress towards merging STM nanolithography with conventional processing technologies to create devices whose electronic function depends on their nanofabricated features. We have successfully patterned the gate regions of silicon MOSFET devices which were fabricated with provisions for STM modification.

Original languageEnglish (US)
Article number1031008
Pages (from-to)111-126
Number of pages16
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume10310
DOIs
StatePublished - Oct 3 1993
EventTechnology of Proximal Probe Lithography 1993 - Bellingham, United States
Duration: Oct 3 1993 → …

Fingerprint

Nanolithography
Microscope
Scanning
Fabrication
Microscopes
microscopes
Electronics
fabrication
scanning
electronics
Quantum Interference
Surface Modification
MOSFET
MOSFET devices
Silicon
Lithography
Merging
charging
Surface treatment
field effect transistors

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Scanning tunneling microscope-based nanolithography for electronic device fabrication. / Lyding, Joseph W.; Brockenbrough, Roger T.; Fay, Patrick J.; Tucker, John R.; Hess, Karl; Higman, Ted K.

In: Proceedings of SPIE - The International Society for Optical Engineering, Vol. 10310, 1031008, 03.10.1993, p. 111-126.

Research output: Contribution to journalConference article

Lyding, Joseph W. ; Brockenbrough, Roger T. ; Fay, Patrick J. ; Tucker, John R. ; Hess, Karl ; Higman, Ted K. / Scanning tunneling microscope-based nanolithography for electronic device fabrication. In: Proceedings of SPIE - The International Society for Optical Engineering. 1993 ; Vol. 10310. pp. 111-126.
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