Scanning system for high-energy electron diffractometry

A. S. Avilov, A. K. Kuligin, U. Pietsch, J. C.H. Spence, V. G. Tsirelson, J. M. Zuo

Research output: Contribution to journalArticlepeer-review

Fingerprint

Dive into the research topics of 'Scanning system for high-energy electron diffractometry'. Together they form a unique fingerprint.

Keyphrases

Engineering

Material Science