@article{20b504db6190409abd1d67d01aee4bf9,
title = "Scanning Probe Microscopy",
author = "Salapaka, {Murti V.} and Salapaka, {Srinivasa M.}",
note = "Funding Information: This research was partially supported by NSF under the grants ECS 0449310 CAR, ECS-0601571, ECS-0330224, CMS-0201516, and ECS-9733802. We wish to thank Kishan Baheti for facilitating workshops and sessions in scanning probe microscopy, which have led to fruitful collaborations among researchers from industry and academia.",
year = "2008",
month = apr,
doi = "10.1109/MCS.2007.914688",
language = "English (US)",
volume = "28",
pages = "65--83",
journal = "IEEE Control Systems",
issn = "1066-033X",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "2",
}