S-parameter based modeling of system-level ESD test bed

Yang Xiu; Nicholas Thomson; Robert Mertens; Elyse Rosenbaum

S-parameter based modeling of system-level ESD test bed

Yang Xiu, Nicholas Thomson, Robert Mertens, Elyse Rosenbaum

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

The IEC 61000-4-2 test bed is modeled with circuit elements extracted from S-parameter measurements. Simulated current waveforms are consistent with measurement for both battery operated and tethered equipment-under-test without customizing the model parameters for each case.

Original language	English (US)
Title of host publication	Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2015
Publisher	ESD Association
ISBN (Electronic)	1585372722, 9781585372737
State	Published - Oct 30 2015
Event	37th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2015 - Reno, United States Duration: Sep 27 2015 → Oct 2 2015

Publication series

Name	Electrical Overstress/Electrostatic Discharge Symposium Proceedings
Volume	2015-October
ISSN (Print)	0739-5159

Other

Other	37th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2015
Country/Territory	United States
City	Reno
Period	9/27/15 → 10/2/15

ASJC Scopus subject areas

Electrical and Electronic Engineering

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S-parameter based modeling of system-level ESD test bed. / Xiu, Yang; Thomson, Nicholas; Mertens, Robert et al.
Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2015. ESD Association, 2015. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; Vol. 2015-October).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Xiu, Y, Thomson, N, Mertens, R & Rosenbaum, E 2015, S-parameter based modeling of system-level ESD test bed. in Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2015. Electrical Overstress/Electrostatic Discharge Symposium Proceedings, vol. 2015-October, ESD Association, 37th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2015, Reno, United States, 9/27/15.

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S-parameter based modeling of system-level ESD test bed

Abstract

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