S-parameter based modeling of system-level ESD test bed

Yang Xiu, Nicholas Thomson, Robert Mertens, Elyse Rosenbaum

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The IEC 61000-4-2 test bed is modeled with circuit elements extracted from S-parameter measurements. Simulated current waveforms are consistent with measurement for both battery operated and tethered equipment-under-test without customizing the model parameters for each case.

Original languageEnglish (US)
Title of host publicationElectrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2015
PublisherESD Association
ISBN (Electronic)1585372722, 9781585372737
StatePublished - Oct 30 2015
Event37th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2015 - Reno, United States
Duration: Sep 27 2015Oct 2 2015

Publication series

NameElectrical Overstress/Electrostatic Discharge Symposium Proceedings
Volume2015-October
ISSN (Print)0739-5159

Other

Other37th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2015
CountryUnited States
CityReno
Period9/27/1510/2/15

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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  • Cite this

    Xiu, Y., Thomson, N., Mertens, R., & Rosenbaum, E. (2015). S-parameter based modeling of system-level ESD test bed. In Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2015 (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; Vol. 2015-October). ESD Association.