Abstract
In many computer vision algorithms, the well known Euclidean or SSD (sum of the squared differences) metric is prevalent and justified from a maximum likelihood perspective when the additive noise is Gaussian. However, Gaussian noise distribution assumption is often invalid. Previous research has found that other metrics such as double exponential metric or Cauchy metric provide better results, in accordance with the maximum likelihood approach. In this paper, we examine different error metrics and provide a general guideline to derive a rich set of nonlinear estimations. Our results on image databases show more robust results are obtained for noise estimation based on the proposed error metric analysis.
Original language | English (US) |
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Article number | 1384937 |
Journal | IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops |
Volume | 2004-January |
Issue number | January |
DOIs | |
State | Published - 2004 |
Event | 2004 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2004 - Washington, United States Duration: Jun 27 2004 → Jul 2 2004 |
ASJC Scopus subject areas
- Computer Vision and Pattern Recognition
- Electrical and Electronic Engineering