Revival of interband crystalline reflectance from nanocrystallites in porous silicon by immersion plating

Zain Yamani, A. Alaql, Joel Therrien, Osama Nayfeh, Munir H Nayfeh

Research output: Contribution to journalArticlepeer-review

Abstract

We prepared porous silicon for which the UV reflectance (3.3-6 eV) is nearly eliminated, and exhibits no features at the Si interband bulk transitions 3.3, 4.3, and 5.5 eV. Plating with a thin layer of copper is found to cause recovery of the UV bulk-like crystalline reflectance and interband resonances. This provides evidence that the loss of crystalline absorption is reversible and is not due to a permanent loss in the crystalline structure. This may relate to a recent model in which the optical activity of ultra small nanocrystallites is produced by a new Si-Si crystalline configuration (or phase), distinct from but interconnected to the diamond-like configuration by a potential barrier.

Original languageEnglish (US)
Pages (from-to)3483-3485
Number of pages3
JournalApplied Physics Letters
Volume74
Issue number23
DOIs
StatePublished - Jun 7 1999

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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