Revealing 3D Defect Structure in van der Waals Ferroelectric α-In2Se3 via Multislice Electron Ptychography

Gillian Nolan; Edmund Han; Shahriar M. Nahid; Patrick T. Carmichael; Arend M. van der Zande; André Schleife; Pinshane Huang

doi:10.1093/mam/ozae044.551

Revealing 3D Defect Structure in van der Waals Ferroelectric α-In₂Se₃ via Multislice Electron Ptychography

Gillian Nolan, Edmund Han, Shahriar M. Nahid, Patrick T. Carmichael, Arend M. van der Zande, André Schleife, Pinshane Huang

Research output: Contribution to journal › Conference article › peer-review

Original language	English (US)
Pages (from-to)	1109
Number of pages	1
Journal	Microscopy and Microanalysis
Volume	30
Issue number	2024
Early online date	Jul 24 2024
DOIs	https://doi.org/10.1093/mam/ozae044.551
State	Published - Jul 24 2024
Event	82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 - Cleveland, United States Duration: Jul 28 2024 → Aug 1 2024

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Instrumentation

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10.1093/mam/ozae044.551

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@article{53e04e37a7504aaa82db1e05065db71a,

title = "Revealing 3D Defect Structure in van der Waals Ferroelectric α-In2Se3 via Multislice Electron Ptychography",

author = "Gillian Nolan and Edmund Han and Nahid, {Shahriar M.} and Carmichael, {Patrick T.} and {van der Zande}, {Arend M.} and Andr{\'e} Schleife and Pinshane Huang",

note = "This work was supported by DOE award number DE-SC0020190, Air Force grant number FA9550-20-1-0302, and NSF-MRSEC award numbers DMR-1720633 and DMR-1555278. This work was carried out in part in the Materials Research Laboratory at the University of Illinois Urbana-Champaign.; 82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 ; Conference date: 28-07-2024 Through 01-08-2024",

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doi = "10.1093/mam/ozae044.551",

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T1 - Revealing 3D Defect Structure in van der Waals Ferroelectric α-In2Se3 via Multislice Electron Ptychography

AU - Nolan, Gillian

AU - Han, Edmund

AU - Nahid, Shahriar M.

AU - Carmichael, Patrick T.

AU - van der Zande, Arend M.

AU - Schleife, André

AU - Huang, Pinshane

N1 - This work was supported by DOE award number DE-SC0020190, Air Force grant number FA9550-20-1-0302, and NSF-MRSEC award numbers DMR-1720633 and DMR-1555278. This work was carried out in part in the Materials Research Laboratory at the University of Illinois Urbana-Champaign.

PY - 2024/7/24

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U2 - 10.1093/mam/ozae044.551

DO - 10.1093/mam/ozae044.551

M3 - Conference article

AN - SCOPUS:85215705689

SN - 1431-9276

VL - 30

SP - 1109

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 2024

T2 - 82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024

Y2 - 28 July 2024 through 1 August 2024