TY - JOUR
T1 - Restoration of high-tilt electron micrographs using a focus series
AU - Delaney, Alexander H.
AU - Belmont, Andrew
N1 - Funding Information:
This work was supported by National Institutes of Health grant R29 GM-42516 and a Whitaker Foundation grant to Andrew Belmont. Electron microscopy was carried out in the Center for Microanalysis of Materials, University of Illinois, which is supported by the US Department of Energy under grant DEFG02-91-ER45439. We would also like to thank Y. Bresler and the reviewers J. Frank, P. Penczek and A.J. Koster for their critical reading of the manuscript.
PY - 1994/12
Y1 - 1994/12
N2 - Electron microscopy tomography requires high-tilt projections. However, the variation in defocus over a highly tilted specimen results in a blurred micrograph, where the blur is spatially varying perpendicular to the tilt axis. This spatially varying blur can cause the micrograph to deviate from an acceptable approximation of the projection of the specimen's density function. In practice, this has been one factor limiting reconstructions of large cellular areas. We derive an algorithm to restore, or deblur, high-tilt electron micrographs using multiple defocused versions of the micrograph. This algorithm consists of digitization and registration of the micrographs, identification of the defocus blur using either a theoretical model or a zero-tilt focus series, and spatially varying restoration using the multiple high-tilt defocused micrographs. Numerical results using simulated and real data are presented, demonstrating the effectiveness of this algorithm.
AB - Electron microscopy tomography requires high-tilt projections. However, the variation in defocus over a highly tilted specimen results in a blurred micrograph, where the blur is spatially varying perpendicular to the tilt axis. This spatially varying blur can cause the micrograph to deviate from an acceptable approximation of the projection of the specimen's density function. In practice, this has been one factor limiting reconstructions of large cellular areas. We derive an algorithm to restore, or deblur, high-tilt electron micrographs using multiple defocused versions of the micrograph. This algorithm consists of digitization and registration of the micrographs, identification of the defocus blur using either a theoretical model or a zero-tilt focus series, and spatially varying restoration using the multiple high-tilt defocused micrographs. Numerical results using simulated and real data are presented, demonstrating the effectiveness of this algorithm.
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U2 - 10.1016/0304-3991(94)90017-5
DO - 10.1016/0304-3991(94)90017-5
M3 - Article
C2 - 7831737
AN - SCOPUS:0028657424
SN - 0304-3991
VL - 56
SP - 319
EP - 335
JO - Ultramicroscopy
JF - Ultramicroscopy
IS - 4
ER -