Response to "comment on 'Investigation of the optical and electronic properties of Ge2Sb2Te5 phase change material in its amorphous, cubic, and hexagonal phases'" [J. Appl. Phys. 97, 093509 (2005)]

Bong Sub Lee; John R. Abelson; Stephen G. Bishop; Dae Hwan Kang; Byung Ki Cheong; Ki Bum Kim

doi:10.1063/1.2426907

Response to "comment on 'Investigation of the optical and electronic properties of Ge₂Sb₂Te₅ phase change material in its amorphous, cubic, and hexagonal phases'" [J. Appl. Phys. 97, 093509 (2005)]

Bong Sub Lee, John R. Abelson, Stephen G. Bishop, Dae Hwan Kang, Byung Ki Cheong, Ki Bum Kim

Research output: Contribution to journal › Review article › peer-review

Abstract

Upon review of experimental conditions, we conclude that the photoinduced current observed in thin film amorphous Ge2 Sb2 Te5 includes a dominant bolometric component under continuous illumination, while the spectrum recorded at a 30 Hz chopping frequency suggests a mixed photoconductive and bolometric response.

Original language	English (US)
Article number	026112
Journal	Journal of Applied Physics
Volume	101
Issue number	2
DOIs	https://doi.org/10.1063/1.2426907
State	Published - 2007

ASJC Scopus subject areas

General Physics and Astronomy

Online availability

10.1063/1.2426907

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Cite this

Lee, B. S., Abelson, J. R., Bishop, S. G., Kang, D. H., Cheong, B. K., & Kim, K. B. (2007). Response to "comment on 'Investigation of the optical and electronic properties of Ge₂Sb₂Te₅ phase change material in its amorphous, cubic, and hexagonal phases'" [J. Appl. Phys. 97, 093509 (2005)]. Journal of Applied Physics, 101(2), Article 026112. https://doi.org/10.1063/1.2426907

Response to "comment on 'Investigation of the optical and electronic properties of Ge₂Sb₂Te₅ phase change material in its amorphous, cubic, and hexagonal phases'" [J. Appl. Phys. 97, 093509 (2005)]. / Lee, Bong Sub; Abelson, John R.; Bishop, Stephen G. et al.
In: Journal of Applied Physics, Vol. 101, No. 2, 026112, 2007.

Research output: Contribution to journal › Review article › peer-review

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