Response to “Comment on ‘Frequency-domain probe beam deflection method for measurement of thermal conductivity of materials on micron length scale’” [Rev. Sci. Instrum. 95, 067101 (2024)]

Jinchi Sun; Guangxin Lv; David G. Cahill

doi:10.1063/5.0216146

Response to “Comment on ‘Frequency-domain probe beam deflection method for measurement of thermal conductivity of materials on micron length scale’” [Rev. Sci. Instrum. 95, 067101 (2024)]

Jinchi Sun, Guangxin Lv, David G. Cahill

Research output: Contribution to journal › Comment/debate › peer-review

Original language	English (US)
Article number	067102
Journal	Review of Scientific Instruments
Volume	95
Issue number	6
DOIs	https://doi.org/10.1063/5.0216146
State	Published - Jun 1 2024
Externally published	Yes

ASJC Scopus subject areas

Instrumentation

Online availability

10.1063/5.0216146

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Response to “Comment on ‘Frequency-domain probe beam deflection method for measurement of thermal conductivity of materials on micron length scale’” [Rev. Sci. Instrum. 95, 067101 (2024)]. / Sun, Jinchi; Lv, Guangxin; Cahill, David G.
In: Review of Scientific Instruments, Vol. 95, No. 6, 067102, 01.06.2024.

Research output: Contribution to journal › Comment/debate › peer-review

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Response to “Comment on ‘Frequency-domain probe beam deflection method for measurement of thermal conductivity of materials on micron length scale’” [Rev. Sci. Instrum. 95, 067101 (2024)]

ASJC Scopus subject areas

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