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Reliable measurement using unreliable binary comparisons
Ryan M. Corey
, Sen Tao
, Naveen Verma
,
Andrew C. Singer
Electrical and Computer Engineering
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Keyphrases
Estimation Problem
100%
Measurement Method
100%
Joint Estimation
100%
Measurement Problem
100%
Statistical Estimation
100%
Measurement Error
100%
Performance Bounds
100%
Physical Quantity
100%
Quantity of Interest
100%
Reliable Measurement
100%
Semiconductor Technology
100%
High Variability
100%
Performance Estimation
100%
Measurement System
100%
Measurement Process
100%
Physical Measurements
100%
Analog-to-digital Converter
100%
Repeated Measurements
100%
Maximum a Posteriori
100%
Level of Measurement
100%
Approximate Minima
100%
Asymptotic Performance
100%
Distributed Sensor Network
100%
Analog-to-digital Conversion
100%
Design Measurement
100%
Dynamic Uncertainty
100%
Converter Circuit
100%
Binary Comparison
100%
Static Uncertainty
100%
Minimum Mean Square Error Method
100%
One-bit Quantization
100%
Unreliable Comparisons
100%
Engineering
Comparator
100%
Mean Square Error
50%
Joint Estimation
50%
Measurement System
50%
Desired Level
50%
Measurement Error
50%
Maximum a Posteriori
50%
Sensor Network
50%
Measurement Process
50%
Analog-to-Digital Converter
50%
Reference Value
50%
Distributed Sensor
50%
Analog to Digital Conversion
50%
Repeated Measurement
50%
Sample Value
50%
Physical Quantity
50%
Computer Science
Comparator
100%
Performance Bound
50%
Statistical Estimation
50%
Measurement System
50%
Measurement Process
50%
Analog-to-Digital Converter
50%
Measurement Error
50%
Estimation Performance
50%
Distributed Sensor Network
50%
Digital Conversion
50%
Measurement Method
50%
Reference Value
50%
Repeated Measurement
50%
Physical Quantity
50%