Relationships between smooth-and small-phase conditions in X-ray phase-contrast imaging

Daxin Shi; Mark A. Anastasio

doi:10.1109/TMI.2009.2026899

Relationships between smooth-and small-phase conditions in X-ray phase-contrast imaging

Research output: Contribution to journal › Article › peer-review

Abstract

We analyze some relationships between the small-and smooth-phase conditions in propagation-based X-ray phase-contrast imaging. Although these conditions are generally well-understood, our analysis yields the identification of physical conditions under which they are mathematically equivalent. We also demonstrate that the smooth-phase condition depends not only on the imaging system resolution and object-to-detector distance, but also on the topography of the wavefield phase function.

Original language	English (US)
Article number	5331297
Pages (from-to)	1969-1973
Number of pages	5
Journal	IEEE Transactions on Medical Imaging
Volume	28
Issue number	12
DOIs	https://doi.org/10.1109/TMI.2009.2026899
State	Published - Dec 2009
Externally published	Yes

Keywords

Phase-retrieval
X-ray phase-contrast imaging

ASJC Scopus subject areas

Electrical and Electronic Engineering
Computer Science Applications
Radiological and Ultrasound Technology
Software

Online availability

10.1109/TMI.2009.2026899

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title = "Relationships between smooth-and small-phase conditions in X-ray phase-contrast imaging",

abstract = "We analyze some relationships between the small-and smooth-phase conditions in propagation-based X-ray phase-contrast imaging. Although these conditions are generally well-understood, our analysis yields the identification of physical conditions under which they are mathematically equivalent. We also demonstrate that the smooth-phase condition depends not only on the imaging system resolution and object-to-detector distance, but also on the topography of the wavefield phase function.",

keywords = "Phase-retrieval, X-ray phase-contrast imaging",

author = "Daxin Shi and Anastasio, {Mark A.}",

note = "Funding Information: Manuscript received May 21, 2009; revised June 10, 2009. Current version published November 25, 2009. This work was supported by the National Science Foundation under Award 0546113 and Award 0854430. Asterisk indicates corresponding author. D. Shi is with the Toshiba Medical Research Institute USA, Vernon Hills, IL 60061 USA. *M. A. Anastasio is with the Department of Biomedical Engineering, Medical Imaging Research Center, Illinois Institute of Technology, Chicago, IL 60616 USA (e-mail: anastasio@iit.edu). Color versions of one or more of the figures in this paper are available online at http://ieeexplore.ieee.org. Digital Object Identifier 10.1109/TMI.2009.2026899 Fig. 1. Measurement geometry in X-ray propagation-based phase-contrast imaging.",

year = "2009",

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doi = "10.1109/TMI.2009.2026899",

language = "English (US)",

volume = "28",

pages = "1969--1973",

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AU - Shi, Daxin

AU - Anastasio, Mark A.

N1 - Funding Information: Manuscript received May 21, 2009; revised June 10, 2009. Current version published November 25, 2009. This work was supported by the National Science Foundation under Award 0546113 and Award 0854430. Asterisk indicates corresponding author. D. Shi is with the Toshiba Medical Research Institute USA, Vernon Hills, IL 60061 USA. *M. A. Anastasio is with the Department of Biomedical Engineering, Medical Imaging Research Center, Illinois Institute of Technology, Chicago, IL 60616 USA (e-mail: anastasio@iit.edu). Color versions of one or more of the figures in this paper are available online at http://ieeexplore.ieee.org. Digital Object Identifier 10.1109/TMI.2009.2026899 Fig. 1. Measurement geometry in X-ray propagation-based phase-contrast imaging.

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N2 - We analyze some relationships between the small-and smooth-phase conditions in propagation-based X-ray phase-contrast imaging. Although these conditions are generally well-understood, our analysis yields the identification of physical conditions under which they are mathematically equivalent. We also demonstrate that the smooth-phase condition depends not only on the imaging system resolution and object-to-detector distance, but also on the topography of the wavefield phase function.

AB - We analyze some relationships between the small-and smooth-phase conditions in propagation-based X-ray phase-contrast imaging. Although these conditions are generally well-understood, our analysis yields the identification of physical conditions under which they are mathematically equivalent. We also demonstrate that the smooth-phase condition depends not only on the imaging system resolution and object-to-detector distance, but also on the topography of the wavefield phase function.

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Relationships between smooth-and small-phase conditions in X-ray phase-contrast imaging

Abstract

Keywords

ASJC Scopus subject areas

Online availability

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