Abstract
Covering arrays are structures for well-representing extremely large input spaces and are used to efficiently implement blackbox testing for software and hardware. This paper proposes refinements over the In-Parameter-Order strategy (for arbitrary t). When constructing homogeneous-alphabet covering arrays, these refinements reduce runtime in nearly all cases by a factor of more than 5 and in some cases by factors as large as 280. This trend is increasing with the number of columns in the covering array. Moreover, the resulting covering arrays are about 5 % smaller. Consequently, this new algorithm has constructed many covering arrays that are the smallest in the literature. A heuristic variant of the algorithm sometimes produces comparably sized covering arrays while running significantly faster.
Original language | English (US) |
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Pages (from-to) | 287-297 |
Number of pages | 11 |
Journal | Journal of Research of the National Institute of Standards and Technology |
Volume | 113 |
Issue number | 5 |
DOIs | |
State | Published - 2008 |
Externally published | Yes |
Keywords
- Blackbox testing
- Covering arrays
- Painvise and higher strength testing
ASJC Scopus subject areas
- General Engineering