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Reducing the costs of bounded-exhaustive testing
Vilas Jagannath
, Yun Young Lee
, Brett Daniel
,
Darko Marinov
Information Trust Institute
Siebel School of Computing and Data Science
Research output
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Chapter in Book/Report/Conference proceeding
›
Conference contribution
Overview
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Keyphrases
Automated Testing
33%
Bounded Exhaustive Testing
100%
Bug Reports
33%
Cluster Group
33%
Execution Time
33%
Fault Detection Capability
33%
Generation Time
33%
Human Time
66%
Inspection Interval
33%
Machine Time
33%
Oracle
33%
Refactoring
33%
Structural Test
33%
Test Case Generation
100%
Test Clustering
33%
Test Execution
66%
Test Input
100%
Test Oracle
33%
Testing Method
33%
Computer Science
bug report
33%
Execution Time
33%
Exhaustive Testing
100%
Fault Detection
33%
Generation Time
33%
Refactoring
33%
Test Generation
100%
Engineering
Check Test
100%
Execution Time
100%
Submitter
100%