TY - CHAP
T1 - Reduced Reparameterized Unified Model Applied to Learning Spatial Rotation Skills
AU - Zhang, Susu
AU - Douglas, Jeffrey A
AU - Wang, Shiyu
AU - Culpepper, Steven Andrew
PY - 2019
Y1 - 2019
N2 - There has been a growing interest in measuring students in a learning context. Cognitive diagnosis models (CDMs) are traditionally used to measure students’ skill mastery at a static time point, but recently, they have been combined with longitudinal models to track students’ changes in skill acquisition over time. In this chapter, we propose a longitudinal learning model with CDMs. We consider different kinds of measurement models, including the reduced-reparameterized unified model (r-RUM) and the noisy input, deterministic-“and”-gate (NIDA) model. We also consider the incorporation of theories on skill hierarchies. Different models are fitted to a data set collected from a computer-based spatial rotation learning program (Wang S, Yang Y, Culpepper SA, Douglas JA, J Educ Behav Stat, 2016. https://doi.org/10.3102.1076998617719727) and we evaluate and compare these models using several goodness-of-fit indices.
AB - There has been a growing interest in measuring students in a learning context. Cognitive diagnosis models (CDMs) are traditionally used to measure students’ skill mastery at a static time point, but recently, they have been combined with longitudinal models to track students’ changes in skill acquisition over time. In this chapter, we propose a longitudinal learning model with CDMs. We consider different kinds of measurement models, including the reduced-reparameterized unified model (r-RUM) and the noisy input, deterministic-“and”-gate (NIDA) model. We also consider the incorporation of theories on skill hierarchies. Different models are fitted to a data set collected from a computer-based spatial rotation learning program (Wang S, Yang Y, Culpepper SA, Douglas JA, J Educ Behav Stat, 2016. https://doi.org/10.3102.1076998617719727) and we evaluate and compare these models using several goodness-of-fit indices.
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U2 - 10.1007/978-3-030-05584-4_24
DO - 10.1007/978-3-030-05584-4_24
M3 - Chapter
SN - 9783030055837
T3 - Methodology of Educational Measurement and Assessment
SP - 503
EP - 524
BT - Handbook of Diagnostic Classification Models
A2 - von Davier, Matthias
A2 - Lee, Young-Sun
PB - Springer
ER -