@article{bbbf4c4159834912bc9a7b328e02d2e9,
title = "Reduced leakage current in Josephson tunnel junctions with codeposited barriers",
abstract = "Josephson junctions were fabricated using two different methods of barrier formation. The trilayers employed were Nb/Al- AlOx /Nb on sapphire, where the first two layers were epitaxial. The oxide barrier was formed either by exposing the Al surface to O2 or by codepositing Al in an O2 background. The codeposition process yielded tunnel junctions that showed the theoretically predicted subgap current and no measurable shunt conductance. In contrast, devices with barriers formed by thermal oxidation showed a small shunt conductance in addition to the predicted subgap current.",
author = "Welander, {Paul B.} and McArdle, {Timothy J.} and Eckstein, {James N.}",
note = "Funding Information: This research was partially funded by the Office of the Director of National Intelligence (ODNI), Intelligence Advanced Research Projects Activity (IARPA) through the Army Research Office. All statements of fact, opinion or conclusions contained herein are those of the authors and should not be construed as representing the official views or policies of IARPA, the ODNI, or the U.S. Government. It was also partially funded by the National Science Foundation through Grant No. EIA 01-21568. AFM and XRD analyses were carried out in the Center for Microanalysis of Materials, University of Illinois at Urbana-Champaign, which is partially supported by the U.S. Department of Energy under Grant No. DEFG02-91ER45439. ",
year = "2010",
month = dec,
day = "6",
doi = "10.1063/1.3518983",
language = "English (US)",
volume = "97",
journal = "Applied Physics Letters",
issn = "0003-6951",
publisher = "American Institute of Physics",
number = "23",
}