Reduced leakage current in Josephson tunnel junctions with codeposited barriers

Paul B. Welander, Timothy J. McArdle, James N. Eckstein

Research output: Contribution to journalArticlepeer-review

Abstract

Josephson junctions were fabricated using two different methods of barrier formation. The trilayers employed were Nb/Al- AlOx /Nb on sapphire, where the first two layers were epitaxial. The oxide barrier was formed either by exposing the Al surface to O2 or by codepositing Al in an O2 background. The codeposition process yielded tunnel junctions that showed the theoretically predicted subgap current and no measurable shunt conductance. In contrast, devices with barriers formed by thermal oxidation showed a small shunt conductance in addition to the predicted subgap current.

Original languageEnglish (US)
Article number233510
JournalApplied Physics Letters
Volume97
Issue number23
DOIs
StatePublished - Dec 6 2010

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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