Abstract
Reconfigurable testing of a high-speed optical link based upon on-wafer probing of an oxide-confined 850 nm vertical-cavity surface-emitting laser (VCSEL) and a GaAs P-i-N photodetector (PD) is demonstrated at a non-return to zero (NRZ) modulated data rate up to 50 Gb/s at room temperature and 43 Gb/s at 85℃ over back-to-back distance. Without any impedance matching network, trans-impedance amplifier, or equalization technique present at the received side, the optical link has not only shown robustness but also achieved outstanding signal-to-noise ratios (SNRs) over the operating temperature range.
Original language | English (US) |
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State | Published - 2019 |
Externally published | Yes |
Event | 2019 International Conference on Compound Semiconductor Manufacturing Technology, CS MANTECH 2019 - Minneapolis, United States Duration: Apr 29 2019 → May 2 2019 |
Conference
Conference | 2019 International Conference on Compound Semiconductor Manufacturing Technology, CS MANTECH 2019 |
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Country/Territory | United States |
City | Minneapolis |
Period | 4/29/19 → 5/2/19 |
Keywords
- High-speed modulation
- On-wafer characterization
- Optical fiber link
ASJC Scopus subject areas
- Hardware and Architecture
- Electrical and Electronic Engineering