Abstract
The role of a shell-like interfacial layer on the ground state recombination energy of confined electron and holes in Si/SiO2 quantum dots was discussed. The depth of the interfacial confinement potential and nanocrystal diameter were also analyzed. The analysis showed that the dependence of the recombination energy on the quantum dot diameter was weakened by the presence of the interface defect.
Original language | English (US) |
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Pages (from-to) | 73-76 |
Number of pages | 4 |
Journal | Physica E: Low-Dimensional Systems and Nanostructures |
Volume | 17 |
Issue number | 1-4 |
DOIs | |
State | Published - Apr 2003 |
Event | Proceedings pf the International Conference on Superlattices - ICSNN 2002 - Touluse, France Duration: Jul 22 2002 → Jul 26 2002 |
Keywords
- Interfacial layer
- Quantum dots
- Recombination energy
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics