Recent progress in microscale modeling of RF sheaths

J. R. Myra; D. Curreli; M. T. Elias; T. G. Jenkins

doi:10.1063/5.0013522

Recent progress in microscale modeling of RF sheaths

J. R. Myra, D. Curreli, M. T. Elias, T. G. Jenkins

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

The microscale properties of RF sheaths in the ion cyclotron range of frequencies (ICRF) are investigated by means of analytical theory, nonlinear fluid and particle-in-cell (PIC) code modeling. Previous work that parametrized RF sheath properties, specifically the RF sheath impedance and the rectified (DC) sheath potential, is generalized to include the effect of net DC current flow through the sheath. Analytical results are presented in the low frequency limit where the displacement current is negligible, and tested against results from a fluid numerical model. It is shown that when the sheath draws DC electron current, the voltage rectification is reduced from the zero current case, and the electron admittance is increased. In separate but related work on the microscale model, selected cases have been simulated with PIC codes to validate, further illuminate and extend fluid model results and their parametrizations. Quantitative agreement in trends for voltage rectification and sheath admittance vs. RF driving voltage is found.

Original language	English (US)
Title of host publication	23rd Topical Conference on Radiofrequency Power in Plasmas
Editors	Paul T. Bonoli, Robert I. Pinsker, Xiaojie Wang
Publisher	American Institute of Physics Inc.
ISBN (Electronic)	9780735420137
DOIs	https://doi.org/10.1063/5.0013522
State	Published - Sep 16 2020
Event	23rd Topical Conference on Radiofrequency Power in Plasmas - Hefei, China Duration: May 14 2019 → May 17 2019

Publication series

Name	AIP Conference Proceedings
Volume	2254
ISSN (Print)	0094-243X
ISSN (Electronic)	1551-7616

Conference

Conference	23rd Topical Conference on Radiofrequency Power in Plasmas
Country	China
City	Hefei
Period	5/14/19 → 5/17/19

ASJC Scopus subject areas

Physics and Astronomy(all)

Access to Document

10.1063/5.0013522

Fingerprint Dive into the research topics of 'Recent progress in microscale modeling of RF sheaths'. Together they form a unique fingerprint.

Cite this

Recent progress in microscale modeling of RF sheaths. / Myra, J. R.; Curreli, D.; Elias, M. T.; Jenkins, T. G.

23rd Topical Conference on Radiofrequency Power in Plasmas. ed. / Paul T. Bonoli; Robert I. Pinsker; Xiaojie Wang. American Institute of Physics Inc., 2020. 50008 (AIP Conference Proceedings; Vol. 2254).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Myra, JR, Curreli, D, Elias, MT & Jenkins, TG 2020, Recent progress in microscale modeling of RF sheaths. in PT Bonoli, RI Pinsker & X Wang (eds), 23rd Topical Conference on Radiofrequency Power in Plasmas., 50008, AIP Conference Proceedings, vol. 2254, American Institute of Physics Inc., 23rd Topical Conference on Radiofrequency Power in Plasmas, Hefei, China, 5/14/19. https://doi.org/10.1063/5.0013522

@inproceedings{2713b57234804d9f868901708c59433d,

title = "Recent progress in microscale modeling of RF sheaths",

abstract = "The microscale properties of RF sheaths in the ion cyclotron range of frequencies (ICRF) are investigated by means of analytical theory, nonlinear fluid and particle-in-cell (PIC) code modeling. Previous work that parametrized RF sheath properties, specifically the RF sheath impedance and the rectified (DC) sheath potential, is generalized to include the effect of net DC current flow through the sheath. Analytical results are presented in the low frequency limit where the displacement current is negligible, and tested against results from a fluid numerical model. It is shown that when the sheath draws DC electron current, the voltage rectification is reduced from the zero current case, and the electron admittance is increased. In separate but related work on the microscale model, selected cases have been simulated with PIC codes to validate, further illuminate and extend fluid model results and their parametrizations. Quantitative agreement in trends for voltage rectification and sheath admittance vs. RF driving voltage is found.",

author = "Myra, {J. R.} and D. Curreli and Elias, {M. T.} and Jenkins, {T. G.}",

note = "Funding Information: This material is based upon work supported by the U.S. Department of Energy Office of Science, Office of Fusion Energy Sciences under Award Numbers DE-FG02-97ER54392, DE-AC05-00OR2272/sub-4000158507, DE-SC0018319 and DE-SC0018090-PO97564.; 23rd Topical Conference on Radiofrequency Power in Plasmas ; Conference date: 14-05-2019 Through 17-05-2019",

year = "2020",

month = sep,

day = "16",

doi = "10.1063/5.0013522",

language = "English (US)",

series = "AIP Conference Proceedings",

publisher = "American Institute of Physics Inc.",

editor = "Bonoli, {Paul T.} and Pinsker, {Robert I.} and Xiaojie Wang",

booktitle = "23rd Topical Conference on Radiofrequency Power in Plasmas",

}

TY - GEN

T1 - Recent progress in microscale modeling of RF sheaths

AU - Myra, J. R.

AU - Curreli, D.

AU - Elias, M. T.

AU - Jenkins, T. G.

N1 - Funding Information: This material is based upon work supported by the U.S. Department of Energy Office of Science, Office of Fusion Energy Sciences under Award Numbers DE-FG02-97ER54392, DE-AC05-00OR2272/sub-4000158507, DE-SC0018319 and DE-SC0018090-PO97564.

PY - 2020/9/16

Y1 - 2020/9/16

N2 - The microscale properties of RF sheaths in the ion cyclotron range of frequencies (ICRF) are investigated by means of analytical theory, nonlinear fluid and particle-in-cell (PIC) code modeling. Previous work that parametrized RF sheath properties, specifically the RF sheath impedance and the rectified (DC) sheath potential, is generalized to include the effect of net DC current flow through the sheath. Analytical results are presented in the low frequency limit where the displacement current is negligible, and tested against results from a fluid numerical model. It is shown that when the sheath draws DC electron current, the voltage rectification is reduced from the zero current case, and the electron admittance is increased. In separate but related work on the microscale model, selected cases have been simulated with PIC codes to validate, further illuminate and extend fluid model results and their parametrizations. Quantitative agreement in trends for voltage rectification and sheath admittance vs. RF driving voltage is found.

AB - The microscale properties of RF sheaths in the ion cyclotron range of frequencies (ICRF) are investigated by means of analytical theory, nonlinear fluid and particle-in-cell (PIC) code modeling. Previous work that parametrized RF sheath properties, specifically the RF sheath impedance and the rectified (DC) sheath potential, is generalized to include the effect of net DC current flow through the sheath. Analytical results are presented in the low frequency limit where the displacement current is negligible, and tested against results from a fluid numerical model. It is shown that when the sheath draws DC electron current, the voltage rectification is reduced from the zero current case, and the electron admittance is increased. In separate but related work on the microscale model, selected cases have been simulated with PIC codes to validate, further illuminate and extend fluid model results and their parametrizations. Quantitative agreement in trends for voltage rectification and sheath admittance vs. RF driving voltage is found.

UR - http://www.scopus.com/inward/record.url?scp=85092049739&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85092049739&partnerID=8YFLogxK

U2 - 10.1063/5.0013522

DO - 10.1063/5.0013522

M3 - Conference contribution

AN - SCOPUS:85092049739

T3 - AIP Conference Proceedings

BT - 23rd Topical Conference on Radiofrequency Power in Plasmas

A2 - Bonoli, Paul T.

A2 - Pinsker, Robert I.

A2 - Wang, Xiaojie

PB - American Institute of Physics Inc.

T2 - 23rd Topical Conference on Radiofrequency Power in Plasmas

Y2 - 14 May 2019 through 17 May 2019

ER -