Recent advances in edge illumination x-ray phase-contrast tomography

Anna Zamir, Charlotte Hagen, Paul C. Diemoz, Marco Endrizzi, Fabio Vittoria, Yujia Chen, Mark A. Anastasio, Alessandro Olivo

Research output: Contribution to journalReview articlepeer-review


Edge illumination (EI) is an x-ray phase-contrast imaging technique, exploiting sensitivity to x-ray refraction to visualize features, which are often not detected by conventional absorption-based radiography.The method does not require a high degree of spatial coherence and is achromatic and, therefore, can be implemented with both synchrotron radiation and commercial x-ray tubes. Using different retrieval algorithms, information about an object's attenuation, refraction, and scattering properties can be obtained. In recent years, a theoretical framework has been developed that enables EI computed tomography (CT) and, hence, three-dimensional imaging. This review provides a summary of these advances, covering the development of different image acquisition schemes, retrieval approaches, and applications. These developments constitute an integral part in the transformation of EI CT into a widely spread imaging tool for use in a range of fields.

Original languageEnglish (US)
Article number040901
JournalJournal of Medical Imaging
Issue number4
StatePublished - Oct 1 2017
Externally publishedYes


  • x-ray imaging; phase contrast; tomography; edge illumination.

ASJC Scopus subject areas

  • Radiology Nuclear Medicine and imaging


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