Real time extraction of polarimetric information at the focal plane

Viktor Gruev, Kejia Wu, Jan Van Der Spiegel, Nader Engheta

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Traditional imaging systems focus on converting light's intensity and color property into suitable electronic signals. An important property of light, polarization is ignored with these traditional imaging systems. Polarization vision contains information about the imaged environment, such as surface shapes, curvature and material properties. Real time extraction of polarization properties would further allow synergy with traditional adaptive spatiotemporal image processing techniques for synthetic imaging. Therefore, we have developed an image sensor with real-time polarimetric extraction capability at the focal plane using low power analog circuits. This novel imaging system is the first of its kind to compute Stokes parameters at the focal plane in real-time. In order to fully describe the polarization state of light in nature, three linear polarized projections or two linear polarized projections in combination with the total intensity are required. We have fabricated a two layer micro polarizer array with total thickness of around 20μm. The micro polarizer array is mounted on top of the imaging sensor. The image sensor is composed of a 256 by 256 photo pixel array, noise suppression circuitry and analog processing circuitry for polarimetric computation. The image sensor was fabricated in 0.18μ process with 10μm pixel pitch and 75% fill factor. Block-parallel pixel read out is employed in order to compute Stokes parameters on a neighborhood of 2 by 2 pixels. The Stokes parameters are presented together with the noise suppressed intensity image. Experimental data from the polarimetric imaging system is also presented.

Original languageEnglish (US)
Title of host publicationPolarization
Subtitle of host publicationMeasurement, Analysis, and Remote Sensing VII
DOIs
StatePublished - 2006
Externally publishedYes
EventPolarization: Measurement, Analysis, and Remote Sensing VII - Kissimmee, FL, United States
Duration: Apr 20 2006Apr 21 2006

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6240
ISSN (Print)0277-786X

Other

OtherPolarization: Measurement, Analysis, and Remote Sensing VII
Country/TerritoryUnited States
CityKissimmee, FL
Period4/20/064/21/06

Keywords

  • Active pixel sensors
  • Current mode imaging
  • Focal plane processing
  • Opto-electronic system
  • Polarimetric extraction

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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