Real-time embedded system support for the BTeV level 1 muon trigger

Michael J. Haney, D. Beauregard, R. Iyer, Z. Kalbarczyk, Q. Liu, L. Wang, M. Haney, M. Selen, D. Mosse, O. Shigiltchoff, R. Chopade, L. Hovey, M. Jung, D. Messie, J. Oh, S. Stone, T. Bapty, S. Neema, S. Nordstrom, S. ShettyS. Vashishtha, D. Yao, P. Sheldon, E. Vaandering, J. Butler, E. Gottschalk, J. Kowalkowski, M. Votava, J. Appel

Research output: Contribution to journalConference article

Abstract

The Level 1 Muon Trigger subsystem for BTeV will be implemented using the same architectural building blocks as the BTeV Level 1 Pixel Trigger: pipelined field programmable gate arrays feeding a farm of dedicated processing elements. The muon trigger algorithm identifies candidate tracks, and is sensitive to the muon charge (sign); candidate dimuon events are identified by complementary charge track-pairs. To insure that the trigger is operating effectively, the trigger development team is actively collaborating in an independent multi-university research program for reliable, self-aware, fault adaptive behavior in real-time embedded systems (RTES). Key elements of the architecture, algorithm, performance, and engineered reliability are presented.

Original languageEnglish (US)
Article numberN36-65
Pages (from-to)1295-1298
Number of pages4
JournalIEEE Nuclear Science Symposium Conference Record
Volume2
StatePublished - Dec 1 2003
Event2003 IEEE Nuclear Science Symposium Conference Record - Nuclear Science Symposium, Medical Imaging Conference - Portland, OR, United States
Duration: Oct 19 2003Oct 25 2003

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ASJC Scopus subject areas

  • Radiation
  • Nuclear and High Energy Physics
  • Radiology Nuclear Medicine and imaging

Cite this

Haney, M. J., Beauregard, D., Iyer, R., Kalbarczyk, Z., Liu, Q., Wang, L., Haney, M., Selen, M., Mosse, D., Shigiltchoff, O., Chopade, R., Hovey, L., Jung, M., Messie, D., Oh, J., Stone, S., Bapty, T., Neema, S., Nordstrom, S., ... Appel, J. (2003). Real-time embedded system support for the BTeV level 1 muon trigger. IEEE Nuclear Science Symposium Conference Record, 2, 1295-1298. [N36-65].