Random-space dimensionality reduction scheme for expedient analysis of microwave structures with manufacturing variability

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A dimensionality reduction scheme is presented for the expedient statistical analysis of microwave structures exhibiting manufacturing variability in geometric and electrical parameters. In the proposed approach, the computational complexity of the high-dimensional random space that is often necessary to describe the stochastic electromagnetic boundary-value problem is mitigated by employing a principal component analysis with sensitivity assessment in combination with an adaptive sparse grid colocation scheme. The proposed method exploits the inherent dependencies between parameters to reduce the number of simulations needed to extract the statistics of desired output response parameters. The attributes of the method are demonstrated through the analysis of the cross talk between the wires of a coupled stripline transmission line structure.

Original languageEnglish (US)
Title of host publication2013 IEEE MTT-S International Microwave Symposium Digest, MTT 2013
DOIs
StatePublished - Dec 1 2013
Event2013 IEEE MTT-S International Microwave Symposium Digest, MTT 2013 - Seattle, WA, United States
Duration: Jun 2 2013Jun 7 2013

Publication series

NameIEEE MTT-S International Microwave Symposium Digest
ISSN (Print)0149-645X

Other

Other2013 IEEE MTT-S International Microwave Symposium Digest, MTT 2013
CountryUnited States
CitySeattle, WA
Period6/2/136/7/13

Keywords

  • Adaptive sparse grid colocation
  • Principal component analysis
  • Sensitivity analysis
  • Statistical variability

ASJC Scopus subject areas

  • Radiation
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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  • Cite this

    Ochoa, J., & Cangellaris, A. (2013). Random-space dimensionality reduction scheme for expedient analysis of microwave structures with manufacturing variability. In 2013 IEEE MTT-S International Microwave Symposium Digest, MTT 2013 [6697372] (IEEE MTT-S International Microwave Symposium Digest). https://doi.org/10.1109/MWSYM.2013.6697372