Random-space dimensionality reduction for expedient yield estimation of passive microwave structures

Juan S. Ochoa, Andreas C Cangellaris

Research output: Contribution to journalArticle

Abstract

A methodology is presented for the expedient statistical analysis of the electromagnetic attributes of passive microwave structures exhibiting manufacturing uncertainty in geometric and material parameters. In the proposed approach, the computational complexity stemming from the high dimensionality of the random space that describes the uncertainty in the electromagnetic analysis of the structure is mitigated by employing a principal component analysis with sensitivity assessment in combination with an adaptive sparse grid collocation scheme. The method exploits the inherent dependencies between random parameters to reduce the number of simulations needed to extract the statistics of the desired output response. This leads to the expedient estimation of production yield by means of the cross-entropy algorithm, which provides for fast calculation of the failure probability for a given functionality criterion. The proposed methodology is demonstrated through its application to the analysis of crosstalk in coupled microstrip lines exhibiting manufacturing variability and the investigation of the variation the bandwidth characteristics of a bandpass filter in the presence of uncertainty in geometric and/or material parameters.

Original languageEnglish (US)
Article number6650011
Pages (from-to)4313-4321
Number of pages9
JournalIEEE Transactions on Microwave Theory and Techniques
Volume61
Issue number12
DOIs
StatePublished - Dec 1 2013

Keywords

  • Interconnects
  • Manufacturing-induced uncertainty
  • Passive components
  • Stochastic electromagnetic modeling
  • Yield estimation

ASJC Scopus subject areas

  • Radiation
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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