Raman scattering as a probe of the superconducting proximity effect

  • L. H. Greene
  • , J. F. Dorsten
  • , I. V. Roshchin
  • , A. C. Abeyta
  • , T. A. Tanzer
  • , G. Kuchler
  • , W. L. Feldmann
  • , P. W. Bohn

Research output: Contribution to journalArticlepeer-review

Abstract

Temperature-dependent Raman spectroscopy is used to investigate the effect of superconductivity on the near-surface electronic structure of a semiconductor in good electrical contact with a superconductor. The light scattering is performed through a high-quality thin (60-100A) film of Nb, grown directly onto in-situ Ar+-etched (100)-n+InAs. Below Tc, the LO mode, associated with the surface charge accumulation layer in the InAs, is enhanced by -40% in comparison with the nearby L_ bulk phonon mode. This change, reversible upon temperature cycling, is observed only when the Nb is in good electrical contact with the InAs. Preliminary results show a similar effect on NbN/InAs. Our results constitute the first optical detection of the superconducting proximity effect.

Original languageEnglish (US)
Pages (from-to)3115-3122
Number of pages8
JournalCzechoslovak Journal of Physics
Volume46
Issue numberSUPPL. 6
DOIs
StatePublished - 1996
Externally publishedYes

ASJC Scopus subject areas

  • General Physics and Astronomy

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