Abstract
The photonic density of states (DOS) of a silicon inverse photonic crystal is probed using the radiative emission of LaF 3:Nd nanoparticles. These emitters are embedded as a thin planar defect within the interior of photonic crystals with varying silicon filling fractions. The alignment of the narrow emission of the particles with the high and low photonic DOS regions is achieved. The time-resolved measurements reveal that the radiative lifetime of the embedded Nd 3+ is strongly influenced by the surrounding DOS provided by the silicon inverse opals.
Original language | English (US) |
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Pages (from-to) | OP153-OP158 |
Journal | Advanced Materials |
Volume | 24 |
Issue number | 23 |
DOIs | |
State | Published - Jun 19 2012 |
Keywords
- nanoparticle emitters
- photonic crystals
- photonic density of states
- rare-earth nanoparticles
- spontaneous emission
ASJC Scopus subject areas
- General Materials Science
- Mechanics of Materials
- Mechanical Engineering