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Radiation damage effects on the silicon microstrip detector in E789 - A fixed target experiment at fermilab

  • J. S. Kapustinsky
  • , M. Apolinski
  • , J. Boissevain
  • , C. N. Brown
  • , G. Brown
  • , T. A. Carey
  • , Y. C. Chen
  • , R. Childers
  • , W. E. Cooper
  • , C. W. Darden
  • , G. Gidal
  • , H. D. Glass
  • , K. N. Gounder
  • , P. M. Ho
  • , D. Isenhower
  • , D. M. Jansen
  • , R. Jeppesen
  • , D. M. Kaplan
  • , G. C. Kiang
  • , M. S. Kowitt
  • D. W. Lane, L. Lederman, M. J. Leitch, J. W. Lillberg, W. Luebke, K. B. Luk, V. M. Martin, P. L. McGaughey, C. S. Mishra, J. M. Moss, J. C. Peng, R. S. Preston, D. Pripstein, J. Sa, M. Sadler, R. Schnathorst, M. H. Schub, R. Schwint, D. Snodgrass, V. N. Tanikella, P. K. Teng, J. W. Wilson

Research output: Contribution to journalArticlepeer-review

Abstract

A Silicon Microstrip Spectrometer has been installed and successfully operated in experiment E789 at Fermilab. The main physics goal of the experiment is to search for charged particle decays of B and D Mesons. Damage effects due to ionizing radiation exposure to the silicon during the experiment are reported.

Original languageEnglish (US)
Pages (from-to)425-430
Number of pages6
JournalNuclear Physics B - Proceedings Supplements
Volume32
Issue numberC
DOIs
StatePublished - May 1993
Externally publishedYes

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Nuclear and High Energy Physics

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