Abstract
The affect of annealing in the electron transport properties of CVD-grown multiwall carbon nanotubes was investigated. The annealed nanotubes showed quasi-ballistic electronic transport with the electronic mean free path (EMFP) reaching a few microns, even at room temperature. It was observed that for the as-produced samples, the peak of the EMFP distribution was found at ∼0.3 μm, while annealed samples were observed at∼0.2 μm. The results show that annealing considerably reduces the amount of defects and leads to a significant increase in the electronic mean free path, which reaches a few microns at room temperature.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 1317-1319 |
| Number of pages | 3 |
| Journal | Carbon |
| Volume | 43 |
| Issue number | 6 |
| DOIs | |
| State | Published - 2005 |
Keywords
- Carbon nanotubes
- Chemical vapor deposition
- Heat treatment
- Thermal analysis
- Transport properties
ASJC Scopus subject areas
- Materials Chemistry