Quantum ellipsometry

Kimani C Toussaint, Ayman F. Abouraddy, Alexander V. Sergienko, Bahaa E.A. Saleh, Malvin C. Teich

Research output: Chapter in Book/Report/Conference proceedingConference contribution


One can obtain absolute ellipsometric data from a reflective sample by employing entangled-photon pairs that are generated by type-II SPDC in a non-collinear configuration. The underlying physics that permits such ellipsometric measurements resides in the fact that fourth-order quantum interference of the photon pairs, in conjunction with polarization entanglement, emulates an idealized classical ellipsometric setup that utilizes a source and a detectro that are both calibrated absolutely.

Original languageEnglish (US)
Title of host publicationConference on Quantum Electronics and Laser Science (QELS) - Technical Digest Series
Number of pages1
StatePublished - 2002
Externally publishedYes
EventQuantum Electronics and Laser Science (QELS) 2002 - Long Beach, CA, United States
Duration: May 19 2002May 24 2002


OtherQuantum Electronics and Laser Science (QELS) 2002
Country/TerritoryUnited States
CityLong Beach, CA

ASJC Scopus subject areas

  • Physics and Astronomy(all)


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