Quantum ellipsometry

Kimani C Toussaint, Ayman F. Abouraddy, Alexander V. Sergienko, Bahaa E.A. Saleh, Malvin C. Teich

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

One can obtain absolute ellipsometric data from a reflective sample by employing entangled-photon pairs that are generated by type-II SPDC in a non-collinear configuration. The underlying physics that permits such ellipsometric measurements resides in the fact that fourth-order quantum interference of the photon pairs, in conjunction with polarization entanglement, emulates an idealized classical ellipsometric setup that utilizes a source and a detectro that are both calibrated absolutely.

Original languageEnglish (US)
Title of host publicationConference on Quantum Electronics and Laser Science (QELS) - Technical Digest Series
Number of pages1
Volume74
StatePublished - 2002
Externally publishedYes
EventQuantum Electronics and Laser Science (QELS) 2002 - Long Beach, CA, United States
Duration: May 19 2002May 24 2002

Other

OtherQuantum Electronics and Laser Science (QELS) 2002
CountryUnited States
CityLong Beach, CA
Period5/19/025/24/02

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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  • Cite this

    Toussaint, K. C., Abouraddy, A. F., Sergienko, A. V., Saleh, B. E. A., & Teich, M. C. (2002). Quantum ellipsometry. In Conference on Quantum Electronics and Laser Science (QELS) - Technical Digest Series (Vol. 74)