Abstract
One can obtain absolute ellipsometric data from a reflective sample by employing entangled-photon pairs that are generated by type-II SPDC in a non-collinear configuration. The underlying physics that permits such ellipsometric measurements resides in the fact that fourth-order quantum interference of the photon pairs, in conjunction with polarization entanglement, emulates an idealized classical ellipsometric setup that utilizes a source and a detectro that are both calibrated absolutely.
| Original language | English (US) |
|---|---|
| Title of host publication | Conference on Quantum Electronics and Laser Science (QELS) - Technical Digest Series |
| Number of pages | 1 |
| Volume | 74 |
| State | Published - 2002 |
| Externally published | Yes |
| Event | Quantum Electronics and Laser Science (QELS) 2002 - Long Beach, CA, United States Duration: May 19 2002 → May 24 2002 |
Other
| Other | Quantum Electronics and Laser Science (QELS) 2002 |
|---|---|
| Country | United States |
| City | Long Beach, CA |
| Period | 5/19/02 → 5/24/02 |
ASJC Scopus subject areas
- Physics and Astronomy(all)
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Cite this
Toussaint, K. C., Abouraddy, A. F., Sergienko, A. V., Saleh, B. E. A., & Teich, M. C. (2002). Quantum ellipsometry. In Conference on Quantum Electronics and Laser Science (QELS) - Technical Digest Series (Vol. 74)